Probability Distributions.- Linear Models for Regression.- Linear Models for Classification.- Neural Networks.- Kernel Methods.- Sparse Kernel Machines.- Graphical Models.- Mixture Models and EM.- Approximate Inference.- Sampling Methods.- Continuous Latent Variables.- Sequential Data.- Combining Models.

Pattern Recognition and Machine Learning

https://users.encs.concordia.ca/~ymzhang/publications/ARC32-2-98Zhang_pp.229-252.pdf

Bibliographical review on reconfigurable fault-tolerant control systems

This ebook is the first authorized digital version of Kernighan and Ritchie's 1988 classic, The C Programming Language (2nd Ed.). One of the best-selling programming books published in the last fifty years, "K&R" has been called everything from the "bible" to "a landmark in computer science" and it has influenced generations of programmers. Available now for all leading ebook platforms, this concise and beautifully written text is a "must-have" reference for every serious programmers digital library.

As modestly described by the authors in the Preface to the First Edition, this "is not an introductory programming manual; it assumes some familiarity with basic programming concepts like variables, assignment statements, loops, and functions. Nonetheless, a novice programmer should be able to read along and pick up the language, although access to a more knowledgeable colleague will help."

The C programming language

With advanced computer technology, systems are getting larger to fulfill more complicated tasks: however, they are also becoming less reliable. Consequently, testing is an indispensable part of system design and implementation; yet it has proved to be a formidable task for complex systems. This motivates the study of testing finite stare machines to ensure the correct functioning of systems and to discover aspects of their behavior. A finite state machine contains a finite number of states and produces outputs on state transitions after receiving inputs. Finite state machines are widely used to model systems in diverse areas, including sequential circuits, certain types of programs, and, more recently, communication protocols. In a testing problem we have a machine about which we lack some information; we would like to deduce this information by providing a sequence of inputs to the machine and observing the outputs produced. Because of its practical importance and theoretical interest, the problem of testing finite state machines has been studied in different areas and at various times. The earliest published literature on this topic dates back to the 1950's. Activities in the 1960's mid early 1970's were motivated mainly by automata theory and sequential circuit testing. The area seemed to have mostly died down until a few years ago when the testing problem was resurrected and is now being studied anew due to its applications to conformance testing of communication protocols. While some old problems which had been open for decades were resolved recently, new concepts and more intriguing problems from new applications emerge. We review the fundamental problems in testing finite state machines and techniques for solving these problems, tracing progress in the area from its inception to the present and the stare of the art. In addition, we discuss extensions of finite state machines and some other topics related to testing.

Principles and methods of testing finite state machines-a survey

Ultrathin films of single-walled carbon nanotubes (SWNTs) represent an attractive, emerging class of material, with properties that can approach the exceptional electrical, mechanical, and optical characteristics of individual SWNTs, in a format that, unlike isolated tubes, is readily suitable for scalable integration into devices. These features suggest the potential for realistic applications as conducting or semiconducting layers in diverse types of electronic, optoelectronic and sensor systems. This article reviews recent advances in assembly techniques for forming such films, modeling and experimental work that reveals their collective properties, and engineering aspects of implementation in sensors and in electronic devices and circuits with various levels of complexity. A concluding discussion provides some perspectives on possibilities for future work in fundamental and applied aspects.

http://www.ifc.dicp.ac.cn/library/cailiao/pdf1/11.pdf

Ultrathin Films of Single-Walled Carbon Nanotubes for Electronics and Sensors: A Review of Fundamental and Applied Aspects

This study presents a new method for application testing of field programmable gate array (FPGA) interconnects at run time. This method utilises new features related to the function for the programming of the look up tables (LUTs), the utilisation (by logic activation/deactivation) of the nets in a interconnect configuration as well as the primary (unused) input/outputs (IOs) of the FPGAs. A new LUT programming function is introduced; the proposed method retains the original interconnect configuration and modifies the function of the LUTs using the so-called 1-bit sum function (1-BSF); the 1-BSF detects all possible stuck-at and bridging faults (of all cardinalities) by utilising the all zeros' vector and a walking-1 test set. As validated by simulation for benchmark circuits (implemented on the Xilinx Virtex4 and Virtex5), the proposed method (with a polynomial time complexity) results in a single test configuration with 100% coverage. These results also show that the proposed method requires a larger number of test vectors and an availability of unused IOs.

https://ietresearch.onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cdt.2012.0117

Single‐configuration fault detection in application‐dependent testing of field programmable gate array interconnects

This paper presents a simulation-based analysis of degradation of a solar cell as induced by temperature and/or time. Based on the double diode model (DDM) and using HSPICE, relationships are found between the parameters of the equivalent electrical circuit and efficiency, process variations and optimization in its operation. The results of this paper show that time, temperature and irradiance are of significance in DDM, because they affect the efficiency of a solar cell when degradation occurs.

Double diode modeling of time/temperature induced degradation of solar cells

An Architecture and an Interconnection Scheme for Time-Sliced Buses in Real-Time Processing.

This paper investigates read-out schemes for a crossbar memory using CNTFET-based elements as cross-points. Two read-out schemes are presented in this paper; the first scheme biases the selected junction and measures the current flowing from the junction toward the ground while the second scheme involves biasing all other unselected bits and/or wordlines. Two figures of merit (the sense voltage on/off ratio and the sense current noise margin) are used to investigate the effectiveness of the proposed schemes for the CNTFET-based crossbar memory. Simulation results show that the CNTFET-based crossbar memory achieves improvements in both sense voltages on/off ratio and noise margin compared to the molecular memory implementation. Therefore, this paper demonstrates that these schemes make the CNTFET-based design a viable candidate for crossbar memory in the nanoscale era.

Read-out schemes for a CNTFET-based crossbar memory

This paper proposes a new analytical approach for evaluating the effects of a repair process on the defect level of multichip module (MCM) systems at assembly. Repair of MCMs is usually required to improve the yield and quality of these systems, while preserving cost effectiveness. In the proposed approach, we develop a novel quality model, which is solved analytically in O(rN/sup 3/) (where r is the maximum number of allowed repair cycles and N is the number of chips in the MCM). The proposed model is based on a previously proposed quality model for MCMs which did not incorporate the effect of a repair process on the defect level. The proposed model relates the defect level to various figures of merit of repair, such as the probability of successfully repairing a fault (referred to as repairability), the probability of damaging the system and the maximum allowed number of repair cycles. Parameteric results show that due to the repair process the overall defect-level decreases as the MCM yield increases; however, there exists a bound in the number of repair cycles, to permit an increase in repairability. Using these results, it is possible to predict a more accurate value of the defect level of MCMs by taking into account the different parameters affecting the repair process, while realistically reducing the defect level of the final MCM product.

Fabrizio Lombardi

Papers

Single‐configuration fault detection in application‐dependent testing of field programmable gate array interconnects

Double diode modeling of time/temperature induced degradation of solar cells

An Architecture and an Interconnection Scheme for Time-Sliced Buses in Real-Time Processing.

Read-out schemes for a CNTFET-based crossbar memory

Quality-effective repair of multichip module systems