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Fabrizio Lombardi

Researcher at Northeastern University

Publications -  677
Citations -  12743

Fabrizio Lombardi is an academic researcher from Northeastern University. The author has contributed to research in topics: Fault detection and isolation & Redundancy (engineering). The author has an hindex of 51, co-authored 639 publications receiving 10357 citations. Previous affiliations of Fabrizio Lombardi include Helsinki University of Technology & Fudan University.

Papers
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Journal ArticleDOI

Analysis and evaluation of multisite testing for VLSI

TL;DR: It is shown that a hybrid approach based on screening chips through a BIST stage improves the performance of multisite test and allows a better utilization of channels in the head of an ATE.
Proceedings ArticleDOI

Design of Approximate Logarithmic Multipliers

TL;DR: The design of both non-iterative and iterative approximate LMs (IALM) are studied to further reduce the power consumption and improve the performance and it is found that the proposed approximate L Ms with appropriate number of inexact bits has achieved even higher accuracy and lower power consumption compared with the conventional LMs using exact units.
Journal ArticleDOI

An Energy-Efficient Online-Learning Stochastic Computational Deep Belief Network

TL;DR: The proposed SC-DBN design achieves a higher classification accuracy compared with the fixed-point implementation and has a significantly lower energy consumption than the pipelined (or non-pipelined) circuit for both online learning and inference processes.
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FsmTest: functional test generation for sequential circuits

TL;DR: Evaluation on MCNC benchmarks has shown the effectiveness of the test algorithm both at functional and gate levels, while achieving in most cases 100% coverage of single stuck-at faults.
Journal ArticleDOI

Design and Evaluation of a Hybrid Memory Cell by Single-Electron Transfer

TL;DR: This paper presents the characterization and design of a static random access memory (SRAM) cell at nanoscale ranges that incorporates a single-electron (SE) turnstile and an SE transistor/MOS circuit in its operation, hence the hybrid nature.