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Fabrizio Lombardi

Researcher at Northeastern University

Publications -  677
Citations -  12743

Fabrizio Lombardi is an academic researcher from Northeastern University. The author has contributed to research in topics: Fault detection and isolation & Redundancy (engineering). The author has an hindex of 51, co-authored 639 publications receiving 10357 citations. Previous affiliations of Fabrizio Lombardi include Helsinki University of Technology & Fudan University.

Papers
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Proceedings ArticleDOI

On the operational features and performance of a memristor-based cell for a LUT of an FPGA

TL;DR: This paper presents the detailed analysis of a memristor-based cell for a Look-Up Table (LUT) of a FPGA and shows that different from previous schemes, the ringing phenomenon of the so-called normalized state parameter does not affect data integrity.
Proceedings ArticleDOI

Array-based testing of FPGAs: architecture and complexity

TL;DR: This paper analyzes the architectural and complexity features of the array-based testing technique for field programmable gate arrays using a hybrid (functional/stuck-at) single fault model by considering both the architecture of the configurable logic block (CLB) and the whole FPGA.
Journal ArticleDOI

High-Performance CMOS Latch Designs for Recovering All Single and Double Node Upsets

TL;DR: Using the polarity of the radiation-induced voltage pulse, a stacked design is proposed; this circuit permits to accomplish protection and SEU recovery at reduced overhead and so at substantially improved performance.
Proceedings ArticleDOI

High throughput and low power dissipation in QCA pipelines using Bennett clocking

TL;DR: This paper presents a detailed analysis of an architectural pipeline scheme for Quantum-dot Cellular Automata that utilizes the so-called Bennett clocking for attaining high throughput and low power dissipation.
Journal ArticleDOI

Concurrent Error Detection of Binary and Nonbinary OLS Parallel Decoders

TL;DR: The proposed CED scheme protects the whole OLS decoder for single stuck-at faults and achieves 100% fault coverage for the whole CED circuit, thus providing a very efficient and fully fault-tolerant implementation.