Probability Distributions.- Linear Models for Regression.- Linear Models for Classification.- Neural Networks.- Kernel Methods.- Sparse Kernel Machines.- Graphical Models.- Mixture Models and EM.- Approximate Inference.- Sampling Methods.- Continuous Latent Variables.- Sequential Data.- Combining Models.

Pattern Recognition and Machine Learning

https://users.encs.concordia.ca/~ymzhang/publications/ARC32-2-98Zhang_pp.229-252.pdf

Bibliographical review on reconfigurable fault-tolerant control systems

This ebook is the first authorized digital version of Kernighan and Ritchie's 1988 classic, The C Programming Language (2nd Ed.). One of the best-selling programming books published in the last fifty years, "K&R" has been called everything from the "bible" to "a landmark in computer science" and it has influenced generations of programmers. Available now for all leading ebook platforms, this concise and beautifully written text is a "must-have" reference for every serious programmers digital library.

As modestly described by the authors in the Preface to the First Edition, this "is not an introductory programming manual; it assumes some familiarity with basic programming concepts like variables, assignment statements, loops, and functions. Nonetheless, a novice programmer should be able to read along and pick up the language, although access to a more knowledgeable colleague will help."

The C programming language

With advanced computer technology, systems are getting larger to fulfill more complicated tasks: however, they are also becoming less reliable. Consequently, testing is an indispensable part of system design and implementation; yet it has proved to be a formidable task for complex systems. This motivates the study of testing finite stare machines to ensure the correct functioning of systems and to discover aspects of their behavior. A finite state machine contains a finite number of states and produces outputs on state transitions after receiving inputs. Finite state machines are widely used to model systems in diverse areas, including sequential circuits, certain types of programs, and, more recently, communication protocols. In a testing problem we have a machine about which we lack some information; we would like to deduce this information by providing a sequence of inputs to the machine and observing the outputs produced. Because of its practical importance and theoretical interest, the problem of testing finite state machines has been studied in different areas and at various times. The earliest published literature on this topic dates back to the 1950's. Activities in the 1960's mid early 1970's were motivated mainly by automata theory and sequential circuit testing. The area seemed to have mostly died down until a few years ago when the testing problem was resurrected and is now being studied anew due to its applications to conformance testing of communication protocols. While some old problems which had been open for decades were resolved recently, new concepts and more intriguing problems from new applications emerge. We review the fundamental problems in testing finite state machines and techniques for solving these problems, tracing progress in the area from its inception to the present and the stare of the art. In addition, we discuss extensions of finite state machines and some other topics related to testing.

Principles and methods of testing finite state machines-a survey

Ultrathin films of single-walled carbon nanotubes (SWNTs) represent an attractive, emerging class of material, with properties that can approach the exceptional electrical, mechanical, and optical characteristics of individual SWNTs, in a format that, unlike isolated tubes, is readily suitable for scalable integration into devices. These features suggest the potential for realistic applications as conducting or semiconducting layers in diverse types of electronic, optoelectronic and sensor systems. This article reviews recent advances in assembly techniques for forming such films, modeling and experimental work that reveals their collective properties, and engineering aspects of implementation in sensors and in electronic devices and circuits with various levels of complexity. A concluding discussion provides some perspectives on possibilities for future work in fundamental and applied aspects.

http://www.ifc.dicp.ac.cn/library/cailiao/pdf1/11.pdf

Ultrathin Films of Single-Walled Carbon Nanotubes for Electronics and Sensors: A Review of Fundamental and Applied Aspects

Diagnosability for fault tolerant parallel systems

This paper deals with the programming and control of non-permanent (soft) switching elements in an augmented interconnection network of a two-dimensional VLSI/WSI array. In particular, it is addressed the issue of cost for programming soft switches involved in the routing process for the interconnections from the primary pad pins. Cost is analyzed with respect to the complexity of the switches (as given by their switching modes) and the number of programming steps involved in establishing the desired interconnections.

On soft switch programming for reconfigurable array systems

This paper presents a BIST design for CCD-based digital imaging system. Pixels on a CCD are not free from defective or faulty pixels due to numerous causes such as imperfect fabrication, excessive exposure to light, radiation, sensing element aging, and excessive mechanical shock, to mention a few. Today's high demand for high-resolution CCDs is dictating defect/fault-tolerance in such devices. Especially, traditional on-device BIST cannot be readily employed on the imaging devices such as CCD due to the unique requirement that no pixel can be utilized to repair or bypass a defect on any other pixels. Therefore, the BIST technique designed and simulated in this paper is a technique to test and repair the defects on pixels off the device, referred to as off-device tolerance. The basic idea was proposed in our previous work in [2] where the off-device defect/fault tolerance was investigated and a soft-test/repair technique was theoretically proposed in order to demonstrate the efficiency and effectiveness in terms of reliability, referred to as virtual yield. A Verilog-based design and simulation is provided to demonstrate the validity of the off-device soft-test/repair in terms of reliability (or virtual yield) enhancement and performance.

/pdf/bist-design-for-ccd-based-digital-imaging-system-533xpg4vd5.pdf

BIST Design for CCD based Digital Imaging System

System-level diagnosis in a multiprocessor system should be both effective and efficient. Most of the existing results are not applicable in practice because of the high diagnosis cost and limited diagnosability. We propose a divide-and-conquer methodology of fault diagnosis for a general class of processor arrays, which is one of the most popular architectures in today's multiprocessor systems. Parallel testing and adaptive diagnosis are our major strategies. The over-d fault problem is inherently tackled through a deterministic method. Based on this unified methodology, we first propose an algorithm for 2D arrays. Moreover, our methodology can be fully explored to those multi-dimensional arrays with high degree of hierarchy like hypercubes. We thus propose another diagnosis algorithm for this kind of architectures. Analytical and simulation results show that our approaches are superior. >

Fabrizio Lombardi

Papers

Diagnosability for fault tolerant parallel systems

On soft switch programming for reconfigurable array systems

BIST Design for CCD based Digital Imaging System

A divide-and-conquer methodology for system-level diagnosis of processor arrays

Design and Analysis of Inexact