Probability Distributions.- Linear Models for Regression.- Linear Models for Classification.- Neural Networks.- Kernel Methods.- Sparse Kernel Machines.- Graphical Models.- Mixture Models and EM.- Approximate Inference.- Sampling Methods.- Continuous Latent Variables.- Sequential Data.- Combining Models.

Pattern Recognition and Machine Learning

https://users.encs.concordia.ca/~ymzhang/publications/ARC32-2-98Zhang_pp.229-252.pdf

Bibliographical review on reconfigurable fault-tolerant control systems

This ebook is the first authorized digital version of Kernighan and Ritchie's 1988 classic, The C Programming Language (2nd Ed.). One of the best-selling programming books published in the last fifty years, "K&R" has been called everything from the "bible" to "a landmark in computer science" and it has influenced generations of programmers. Available now for all leading ebook platforms, this concise and beautifully written text is a "must-have" reference for every serious programmers digital library.

As modestly described by the authors in the Preface to the First Edition, this "is not an introductory programming manual; it assumes some familiarity with basic programming concepts like variables, assignment statements, loops, and functions. Nonetheless, a novice programmer should be able to read along and pick up the language, although access to a more knowledgeable colleague will help."

The C programming language

With advanced computer technology, systems are getting larger to fulfill more complicated tasks: however, they are also becoming less reliable. Consequently, testing is an indispensable part of system design and implementation; yet it has proved to be a formidable task for complex systems. This motivates the study of testing finite stare machines to ensure the correct functioning of systems and to discover aspects of their behavior. A finite state machine contains a finite number of states and produces outputs on state transitions after receiving inputs. Finite state machines are widely used to model systems in diverse areas, including sequential circuits, certain types of programs, and, more recently, communication protocols. In a testing problem we have a machine about which we lack some information; we would like to deduce this information by providing a sequence of inputs to the machine and observing the outputs produced. Because of its practical importance and theoretical interest, the problem of testing finite state machines has been studied in different areas and at various times. The earliest published literature on this topic dates back to the 1950's. Activities in the 1960's mid early 1970's were motivated mainly by automata theory and sequential circuit testing. The area seemed to have mostly died down until a few years ago when the testing problem was resurrected and is now being studied anew due to its applications to conformance testing of communication protocols. While some old problems which had been open for decades were resolved recently, new concepts and more intriguing problems from new applications emerge. We review the fundamental problems in testing finite state machines and techniques for solving these problems, tracing progress in the area from its inception to the present and the stare of the art. In addition, we discuss extensions of finite state machines and some other topics related to testing.

Principles and methods of testing finite state machines-a survey

Ultrathin films of single-walled carbon nanotubes (SWNTs) represent an attractive, emerging class of material, with properties that can approach the exceptional electrical, mechanical, and optical characteristics of individual SWNTs, in a format that, unlike isolated tubes, is readily suitable for scalable integration into devices. These features suggest the potential for realistic applications as conducting or semiconducting layers in diverse types of electronic, optoelectronic and sensor systems. This article reviews recent advances in assembly techniques for forming such films, modeling and experimental work that reveals their collective properties, and engineering aspects of implementation in sensors and in electronic devices and circuits with various levels of complexity. A concluding discussion provides some perspectives on possibilities for future work in fundamental and applied aspects.

http://www.ifc.dicp.ac.cn/library/cailiao/pdf1/11.pdf

Ultrathin Films of Single-Walled Carbon Nanotubes for Electronics and Sensors: A Review of Fundamental and Applied Aspects

Self-assembly is affected by high error rates due to incorrect tiles in nano-technology manufacturing. Tile sets that can heal (fully or partially) an erroneous assembly have been proposed. Self-healing requires growth to be restarted such that erroneous tiles can be removed and the correct tiles to bind to the aggregate. Punctures can be used for this purpose. The goal of this paper is to characterize an intentionally induced puncture (and its relevant properties) on an erroneous tile site in the assembly. This allows to propagate any newly generated error away from the source of growth (i.e. the seed tile), such that self-assembly can continue along specific directions. Different types of puncture are considered with respect to growth direction, error and aggregate types. Puncture resilience is analyzed using a new characterization metric; different tile sets are investigated in detail. Analytical and simulation results are provided.

Error Tolerance of DNA Self-Healing Assemblies by Puncturing

We propose the design, fabrication, experimental implementation, and equivalent circuit model of a magneto-electric (ME) sensing device for determining the magnitude and direction of low-frequency ac magnetic fields. The device consists of two capacitive ME thin-film sensors fabricated by means of the laser ablation technique inside a pulsed laser deposition (PLD) chamber. The films are grown on a 500-nm thick indium tin oxide layer on $1.5\times 1.5$ cm2 silicon substrates using two deposition methods, namely, single target (ST) and multiple target (MT). The proposed setup is used to detect ac magnetic fields generated from a solenoid coil located at a distance of 10 mm. The experimental results demonstrate that the proposed magnetic field sensing approach using the MT method can establish the magnitude and direction of external magnetic fields with detection errors below 8%. Based on the experimental observations, we also establish a mathematical expression describing the direct ME coupling effect observed in M-type strontium hexaferrite thin films. Subsequently, we develop an electrical circuit model that can accurately predict device behavior using circuit simulations. The differential output voltages at different field strengths are predicted for both ST and MT films by simulating this equivalent circuit using the LTspice software from Linear Technology. The simulation results are in good agreement with the experimental data both qualitatively and quantitatively, and the average difference between the two ranges from 5% to 19% in the worst case.

Magnetic Field Sensors Based on the Direct Magneto-Electric Effect in Hexaferrite Thin Films and the Equivalent Circuit Model

This paper proposes two non-volatile content addressable memory (CAM) cells using magnetic tunneling junction (MTJ) devices and nanoscaled CMOS transistors. The first novelty of the proposed non-volatile cells is that their operation and comparison outcome are voltage-based, hence requiring no current sensor. Two types of MTJ CAM cell are proposed; each of them utilizes two MTJs in a voltage divider arrangement. They differ in the number of required transistors, i.e. the first is a NOR type cell requiring six MOSFETs, while the second is a NAND type cell requiring five MOSFETs. Performance metrics (as related to search delay, power dissipation and static noise margin) as well as variation to process, voltage and temperature (PVT) are assessed by simulation at different feature sizes of the MOSFETs. The simulation results show that the proposed designs significantly improve in terms of search delay and power delay product (PDP) over existing non-volatile CAM memory cells utilizing MTJs.

Design and evaluation of two MTJ-based content addressable non-volatile memory cells

This paper presents the design of a content addressable memory (CAM) cell. This cell utilizes a phase change memory (PCM) as a storage element and an ambipolar transistor for data comparison; the operation of the ambipolar transistor is controlled by voltage at the polarity gate. A memory core consisting of a CMOS transistor and a PCM is employed (1T1P). For the search operation, the data in the 1T1P memory core are read and its values are established by using a differential sense amplifier. The proposed CAM cell is simulated and compared with other nonvolatile CAM cells by using emerging technologies (such as MTJ and memristor). The simulation results show that as the proposed CAM cell operates on a voltage basis, it offers significant advantages in terms of power delay product for the search operation and reduced circuit complexity (in terms of lower transistor and storage element counts) compared with other designs found in the technical literature.

Design and Comparative Evaluation of a PCM-Based CAM (Content Addressable Memory) Cell

We examine the diagnosis of processor array systems formed as two-dimensional arrays, with boundaries, and either four or eight neighbors for each interior processor. We employ a parallel test schedule. Neighboring processors test each other, and report the results. Our diagnostic objective is to find a fault-free processor or set of processors. The system may then be sequentially diagnosed by repairing those processors tested faulty according to the identified fault-free set, or a job may be run on the identified fault-free processors. We establish an upper bound on the maximum number of faults which can be sustained without invalidating the test results under worst case conditions. We give test schedules and diagnostic algorithms which meet the upper bound as far as the highest order term. We compare these near optimal diagnostic algorithms to alternative algorithms, both new and already in the literature, and against an upper bound ideal case algorithm, which is not necessarily practically realizable. For eight-way array systems with N processors, an ideal algorithm has diagnosability 3N/sup 2/3/-2N/sup 1/2/ plus lower-order terms. No algorithm exists which can exceed this. We give an algorithm which starts with tests on diagonally connected processors, and which achieves approximately this diagnosability. So the given algorithm is optimal to within the two most significant terms of the maximum diagnosability. Similarly, for four-way array systems with N processors, no algorithm can have diagnosability exceeding 3N/sup 2/3//2/sup 1/3/-2N/sup 1/2/ plus lower-order terms. And we give an algorithm which begins with tests arranged in a zigzag pattern, one consisting of pairing nodes for tests in two different directions in two consecutive test stages; this algorithm achieves diagnosability (3/2)(5/2)/sup 1/3/N/sup 2/3/-(5/4)N/sup 1/2/ plus lower-order terms, which is about 0.85 of the upper bound due to an ideal algorithm.

Fabrizio Lombardi

Papers

Error Tolerance of DNA Self-Healing Assemblies by Puncturing

Magnetic Field Sensors Based on the Direct Magneto-Electric Effect in Hexaferrite Thin Films and the Equivalent Circuit Model

Design and evaluation of two MTJ-based content addressable non-volatile memory cells

Design and Comparative Evaluation of a PCM-Based CAM (Content Addressable Memory) Cell

Sequential diagnosis of processor array systems