Probability Distributions.- Linear Models for Regression.- Linear Models for Classification.- Neural Networks.- Kernel Methods.- Sparse Kernel Machines.- Graphical Models.- Mixture Models and EM.- Approximate Inference.- Sampling Methods.- Continuous Latent Variables.- Sequential Data.- Combining Models.

Pattern Recognition and Machine Learning

https://users.encs.concordia.ca/~ymzhang/publications/ARC32-2-98Zhang_pp.229-252.pdf

Bibliographical review on reconfigurable fault-tolerant control systems

This ebook is the first authorized digital version of Kernighan and Ritchie's 1988 classic, The C Programming Language (2nd Ed.). One of the best-selling programming books published in the last fifty years, "K&R" has been called everything from the "bible" to "a landmark in computer science" and it has influenced generations of programmers. Available now for all leading ebook platforms, this concise and beautifully written text is a "must-have" reference for every serious programmers digital library.

As modestly described by the authors in the Preface to the First Edition, this "is not an introductory programming manual; it assumes some familiarity with basic programming concepts like variables, assignment statements, loops, and functions. Nonetheless, a novice programmer should be able to read along and pick up the language, although access to a more knowledgeable colleague will help."

The C programming language

With advanced computer technology, systems are getting larger to fulfill more complicated tasks: however, they are also becoming less reliable. Consequently, testing is an indispensable part of system design and implementation; yet it has proved to be a formidable task for complex systems. This motivates the study of testing finite stare machines to ensure the correct functioning of systems and to discover aspects of their behavior. A finite state machine contains a finite number of states and produces outputs on state transitions after receiving inputs. Finite state machines are widely used to model systems in diverse areas, including sequential circuits, certain types of programs, and, more recently, communication protocols. In a testing problem we have a machine about which we lack some information; we would like to deduce this information by providing a sequence of inputs to the machine and observing the outputs produced. Because of its practical importance and theoretical interest, the problem of testing finite state machines has been studied in different areas and at various times. The earliest published literature on this topic dates back to the 1950's. Activities in the 1960's mid early 1970's were motivated mainly by automata theory and sequential circuit testing. The area seemed to have mostly died down until a few years ago when the testing problem was resurrected and is now being studied anew due to its applications to conformance testing of communication protocols. While some old problems which had been open for decades were resolved recently, new concepts and more intriguing problems from new applications emerge. We review the fundamental problems in testing finite state machines and techniques for solving these problems, tracing progress in the area from its inception to the present and the stare of the art. In addition, we discuss extensions of finite state machines and some other topics related to testing.

Principles and methods of testing finite state machines-a survey

Ultrathin films of single-walled carbon nanotubes (SWNTs) represent an attractive, emerging class of material, with properties that can approach the exceptional electrical, mechanical, and optical characteristics of individual SWNTs, in a format that, unlike isolated tubes, is readily suitable for scalable integration into devices. These features suggest the potential for realistic applications as conducting or semiconducting layers in diverse types of electronic, optoelectronic and sensor systems. This article reviews recent advances in assembly techniques for forming such films, modeling and experimental work that reveals their collective properties, and engineering aspects of implementation in sensors and in electronic devices and circuits with various levels of complexity. A concluding discussion provides some perspectives on possibilities for future work in fundamental and applied aspects.

http://www.ifc.dicp.ac.cn/library/cailiao/pdf1/11.pdf

Ultrathin Films of Single-Walled Carbon Nanotubes for Electronics and Sensors: A Review of Fundamental and Applied Aspects

In this paper, a new structural approach is proposed for the full diagnosis (with no aliasing and confounding) of shorts and stuck-at faults in the interconnect of a perfect shuffle. This approach utilizes graph coloring techniques to generate a test set based on the adjacencies in the largest necklace of the shuffle. The conditions for no aliasing and confounding as well as fault detection are presented as function of the largest short fault. For detecting stuck-at faults, it is shown that a constant number of tests is required. A test generation algorithm with quadratic execution complexity in the size of the shuffle is proposed. This algorithm generates a test set which diagnoses a perfect shuffle of size N with no aliasing and confounding using O(log/sub 2/(log/sub 2/ (N))) tests. The application of these results to multistage interconnection networks (MINs) is also presented: MINs can be constructed by cascading perfect shuffles and are characterized by switching operation. It is shown that constant testability of MINs can be still achieved for diagnosis under fault models which preserve the loop properties of the necklaces in a perfect shuffle.

On the test and diagnosis of the perfect shuffle

Fault detection in TFCMOS/DFCMOS combinational gates

Generating non-standard random distributions for discrete event simulation systems

This paper presents a method for operational testing of a memristor-based look-up table (LUT) memory block. In the proposed method the deterioration of the memristors (as storage elements of a LUT), is modeled based on the reduction of the resistance range, a phenomenon well known as reported in the technical literature. A quiescent current technique is used to diagnose the memristors when deterioration results in a change of state, thus leading to a fault. In addition to testing, the proposed method can be utilized also for continuous monitoring of the memristor deterioration in the LUT. The deterioration of the memristors is modeled using a simple yet accurate equivalent circuit. The proposed method is simulated using LTSPICE and extensive simulation results are presented for operational deterioration with respect to different features such as LUT dimension, range of memristance and MOSFET feature size. These results show that the proposed test method is highly efficient for testing and monitoring a LUT in the presence of deteriorating multiple memristors.

Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT

In computing, old words are reused by giving them new meanings. However, many people may not be aware of the origin of ancient words that have found new uses in computing. We advocate for basic computing science and engineering courses to cover the origins of the most common ancient words used in computing.

/pdf/latin-and-greek-in-computing-ancient-words-in-a-new-world-5ma3jbr4.pdf

Fabrizio Lombardi

Papers

On the test and diagnosis of the perfect shuffle

Fault detection in TFCMOS/DFCMOS combinational gates

Generating non-standard random distributions for discrete event simulation systems

Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT

Latin and Greek in Computing: Ancient Words in a New World