Probability Distributions.- Linear Models for Regression.- Linear Models for Classification.- Neural Networks.- Kernel Methods.- Sparse Kernel Machines.- Graphical Models.- Mixture Models and EM.- Approximate Inference.- Sampling Methods.- Continuous Latent Variables.- Sequential Data.- Combining Models.

Pattern Recognition and Machine Learning

https://users.encs.concordia.ca/~ymzhang/publications/ARC32-2-98Zhang_pp.229-252.pdf

Bibliographical review on reconfigurable fault-tolerant control systems

This ebook is the first authorized digital version of Kernighan and Ritchie's 1988 classic, The C Programming Language (2nd Ed.). One of the best-selling programming books published in the last fifty years, "K&R" has been called everything from the "bible" to "a landmark in computer science" and it has influenced generations of programmers. Available now for all leading ebook platforms, this concise and beautifully written text is a "must-have" reference for every serious programmers digital library.

As modestly described by the authors in the Preface to the First Edition, this "is not an introductory programming manual; it assumes some familiarity with basic programming concepts like variables, assignment statements, loops, and functions. Nonetheless, a novice programmer should be able to read along and pick up the language, although access to a more knowledgeable colleague will help."

The C programming language

With advanced computer technology, systems are getting larger to fulfill more complicated tasks: however, they are also becoming less reliable. Consequently, testing is an indispensable part of system design and implementation; yet it has proved to be a formidable task for complex systems. This motivates the study of testing finite stare machines to ensure the correct functioning of systems and to discover aspects of their behavior. A finite state machine contains a finite number of states and produces outputs on state transitions after receiving inputs. Finite state machines are widely used to model systems in diverse areas, including sequential circuits, certain types of programs, and, more recently, communication protocols. In a testing problem we have a machine about which we lack some information; we would like to deduce this information by providing a sequence of inputs to the machine and observing the outputs produced. Because of its practical importance and theoretical interest, the problem of testing finite state machines has been studied in different areas and at various times. The earliest published literature on this topic dates back to the 1950's. Activities in the 1960's mid early 1970's were motivated mainly by automata theory and sequential circuit testing. The area seemed to have mostly died down until a few years ago when the testing problem was resurrected and is now being studied anew due to its applications to conformance testing of communication protocols. While some old problems which had been open for decades were resolved recently, new concepts and more intriguing problems from new applications emerge. We review the fundamental problems in testing finite state machines and techniques for solving these problems, tracing progress in the area from its inception to the present and the stare of the art. In addition, we discuss extensions of finite state machines and some other topics related to testing.

Principles and methods of testing finite state machines-a survey

Ultrathin films of single-walled carbon nanotubes (SWNTs) represent an attractive, emerging class of material, with properties that can approach the exceptional electrical, mechanical, and optical characteristics of individual SWNTs, in a format that, unlike isolated tubes, is readily suitable for scalable integration into devices. These features suggest the potential for realistic applications as conducting or semiconducting layers in diverse types of electronic, optoelectronic and sensor systems. This article reviews recent advances in assembly techniques for forming such films, modeling and experimental work that reveals their collective properties, and engineering aspects of implementation in sensors and in electronic devices and circuits with various levels of complexity. A concluding discussion provides some perspectives on possibilities for future work in fundamental and applied aspects.

http://www.ifc.dicp.ac.cn/library/cailiao/pdf1/11.pdf

Ultrathin Films of Single-Walled Carbon Nanotubes for Electronics and Sensors: A Review of Fundamental and Applied Aspects

Self-assembly has been employed in nano-technology to build crystals using individual components (commonly referred to as tiles) with limited control. Templates of regular lattice structures for two-dimensional scaffolds and interconnects have been implemented by self-assembly. This paper proposes a diagonally-based growth scheme that is applicable to these templates. Differently from previous techniques (mostly sequential in execution), growth is allowed along two different directions in the aggregate, thus permitting a parallel mode of operation. This is made possible by initially utilizing a tile set and binding scheme to allow multiple seed tiles to grow along the main diagonal of the pattern. The conditions by which this type of new growth is possible at a reduced error occurrence in mismatched tiles, are presented; error tolerance is achieved by employing robust generation of the seed and diagonal tiles. Simulation results are presented using Xgrow [10].

Robust self-assembly of interconnects by parallel DNA growth

In VLSI arrays, redundant cells are added as spares. The proposed approach is applicable as an offline technique at either production time and/or run time. Reconfiguration is implemented by index mapping using a sequence of two operators. A reconfiguration algorithm which utilizes index mapping is proposed. This algorithm uses a new approach to the assignment problem. It is shown that reconfiguration of fault-free cells is equivalent to a covering of faulty cells by spare cells. It is also established that in a two-dimensional array the optimal spare assignment is given by a maximum matching. This translates to a maximum flow. It is shown that a variation of the matching preserves the optimality of the assignment, while reducing the time complexity of the reconfiguration algorithm Characterization theorems for index mapping and simulation results to substantiate the practicality of the approach are presented. >

Reconfiguration of VLSI arrays by covering

Traditional adaptive centralized system diagnosis assumes a fully connected network topology, hence it can not be used in a number of classes of multiprocessor systems, such as meshes. This paper proposes an adaptive system-level diagnosis algorithm for meshes with wraparound, such as Intel Paragon machine. It is proved that the diagnosis cost required by the proposed approach is lower than the known diagnosis algorithms which can be applied to mesh architectures. Also over-d fault problem can be efficiently solved by our method, where d is the diagnosability.

An Adaptive System-Level Diagnosis Approach for Mesh Connected Multiprocessors

The design of easily testable CMOS combinational circuits is discussed. Two CMOS structured design techniques are presented. The novelty of this approach is the complete fault detection of single- and multiple-line stuck-at, transistor stuck-open, and stuck-on faults for combinational circuits. The test algorithm requires only minimal modifications to detect a large number of bridging faults. These techniques are both based on the addition of two transistors, a P-FET and an N-FET, which are placed in series between the P and N sections. In the first case (dynamic fully CMOS, DFCMOS), the transistors are controlled by a single input; in the other case (testable fully CMOS, TFCMOS), there is one input for each additional transistor. The test procedure is presented, and it is shown that multiple fault detection can be easily achieved. >

Design for testability techniques for CMOS combinational gates

For some applications, errors have a different impact on data and memory systems depending on whether they change a zero to a one or the other way around; for an unsigned integer, a one to zero (or zero to one) error reduces (or increases) the value. For some memories, errors are also asymmetric; for example, in a DRAM, retention failures discharge the storage cell. The tolerance of such asymmetric errors would result in a robust and efficient system design. Error Control Codes (ECCs) are one common technique for memory protection against these errors by introducing some redundancy in memory cells. In this paper, the asymmetry in the errors in Embedded DRAMs (eDRAMs) is exploited for error-tolerant designs without using any ECC or parity, which are redundancy-free in terms of memory cells. A model for the impact of retention errors and refresh time of eDRAMs on the False Positive rate or False Negative rate of some eDRAM applications is proposed and analyzed. Bloom Filters (BFs) and read-only or write-through caches implemented in eDRAMs are considered as the first case studies for this model. For BFs, their tolerance to some zero to one errors (but not one to zero errors) is combined with the asymmetry of retention errors in eDRAMs to show that no ECC or parity is needed to protect the filter; moreover, the eDRAM refresh time can significantly be increased, thus reducing its power consumption. For caches, this paper shows that asymmetry in errors can be exploited also by using a redundancy-free error-tolerant scheme, which only introduces false negatives, but no false positives, therefore causing no data corruption. The proposed redundancy-free implementations have been compared with existing schemes for BFs and caches to show the benefits in terms of different figures of merit such as memory size, area, decoder/encoder complexity and delay. Finally, in the last case study, we show that the asymmetry of retention errors can be used to develop additional error correction capabilities in Modular Redundancy Schemes.

Fabrizio Lombardi

Papers

Robust self-assembly of interconnects by parallel DNA growth

Reconfiguration of VLSI arrays by covering

An Adaptive System-Level Diagnosis Approach for Mesh Connected Multiprocessors

Design for testability techniques for CMOS combinational gates

Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design