Probability Distributions.- Linear Models for Regression.- Linear Models for Classification.- Neural Networks.- Kernel Methods.- Sparse Kernel Machines.- Graphical Models.- Mixture Models and EM.- Approximate Inference.- Sampling Methods.- Continuous Latent Variables.- Sequential Data.- Combining Models.

Pattern Recognition and Machine Learning

https://users.encs.concordia.ca/~ymzhang/publications/ARC32-2-98Zhang_pp.229-252.pdf

Bibliographical review on reconfigurable fault-tolerant control systems

This ebook is the first authorized digital version of Kernighan and Ritchie's 1988 classic, The C Programming Language (2nd Ed.). One of the best-selling programming books published in the last fifty years, "K&R" has been called everything from the "bible" to "a landmark in computer science" and it has influenced generations of programmers. Available now for all leading ebook platforms, this concise and beautifully written text is a "must-have" reference for every serious programmers digital library.

As modestly described by the authors in the Preface to the First Edition, this "is not an introductory programming manual; it assumes some familiarity with basic programming concepts like variables, assignment statements, loops, and functions. Nonetheless, a novice programmer should be able to read along and pick up the language, although access to a more knowledgeable colleague will help."

The C programming language

With advanced computer technology, systems are getting larger to fulfill more complicated tasks: however, they are also becoming less reliable. Consequently, testing is an indispensable part of system design and implementation; yet it has proved to be a formidable task for complex systems. This motivates the study of testing finite stare machines to ensure the correct functioning of systems and to discover aspects of their behavior. A finite state machine contains a finite number of states and produces outputs on state transitions after receiving inputs. Finite state machines are widely used to model systems in diverse areas, including sequential circuits, certain types of programs, and, more recently, communication protocols. In a testing problem we have a machine about which we lack some information; we would like to deduce this information by providing a sequence of inputs to the machine and observing the outputs produced. Because of its practical importance and theoretical interest, the problem of testing finite state machines has been studied in different areas and at various times. The earliest published literature on this topic dates back to the 1950's. Activities in the 1960's mid early 1970's were motivated mainly by automata theory and sequential circuit testing. The area seemed to have mostly died down until a few years ago when the testing problem was resurrected and is now being studied anew due to its applications to conformance testing of communication protocols. While some old problems which had been open for decades were resolved recently, new concepts and more intriguing problems from new applications emerge. We review the fundamental problems in testing finite state machines and techniques for solving these problems, tracing progress in the area from its inception to the present and the stare of the art. In addition, we discuss extensions of finite state machines and some other topics related to testing.

Principles and methods of testing finite state machines-a survey

Ultrathin films of single-walled carbon nanotubes (SWNTs) represent an attractive, emerging class of material, with properties that can approach the exceptional electrical, mechanical, and optical characteristics of individual SWNTs, in a format that, unlike isolated tubes, is readily suitable for scalable integration into devices. These features suggest the potential for realistic applications as conducting or semiconducting layers in diverse types of electronic, optoelectronic and sensor systems. This article reviews recent advances in assembly techniques for forming such films, modeling and experimental work that reveals their collective properties, and engineering aspects of implementation in sensors and in electronic devices and circuits with various levels of complexity. A concluding discussion provides some perspectives on possibilities for future work in fundamental and applied aspects.

http://www.ifc.dicp.ac.cn/library/cailiao/pdf1/11.pdf

Ultrathin Films of Single-Walled Carbon Nanotubes for Electronics and Sensors: A Review of Fundamental and Applied Aspects

Quantum-dot Cellular Automata (QCA) is a promising nanochnology that offers significant improvements in diverse areas (such as power dissipation) over CMOS. Recently, QCA has been advocated as a potential candidate technology for implementing reversible computing. However, existing tools for QCA design and evaluation have limited capabilities. A simple but versatile mechanical-based model has been proposed in the past for computing in QCA. This paper presents a thermodynamic analysis using this mechnical QCA model. Different circuits are analyzed for reversible computing. As applicable to QCA, two clocking schemes, namely Landauer clocking and Bennett clocking, are analyzed for energy dissipation and performance.

Energy Analysis of QCA Circuits for Reversible Computing

Compression has been used in automatic test equipment (ATE) to reduce storage and application time for high volume data by exploiting the repetitive nature of test vectors. The application of a binary compression method to an ATE environment for manufacturing is studied using a technique, referred to as reuse. In reuse, compression is achieved by partitioning the vector set and removing repeating segments. This process has O(n/sup 2/) time complexity for compression (where n is the number of vectors) with a simple hardware decoding circuitry. It is shown that for industrial system-on-chip (SoC) designs, the efficiency of the reuse compression technique is comparable to sophisticated software techniques with the advantage of easy and fast decoding. Two shift register-based decompression schemes are presented; they can be either incorporated into internal scan chains or built in the tester's head. The proposed compression method has been applied to industrial test and data and an average compression rate of 84% has been achieved.

Using data compression in automatic test equipment for system-on-chip testing

Different schemes for approximate computing of matrix multiplication (MM) in systolic arrays are presented in this manuscript. Inexact full adder cells are utilized in a processing element (PE) for the Baugh-Wooley multiplier and/or the final adder as circuits implementing the two computational steps required for MM. An extensive analysis and simulation-based assessment of three inexact schemes for the PE are pursued with respect to circuit level performance (such as delay, power consumption and number of transistors) and figures of merit of approximate computing (such as the error distance). The execution of MM in each PE results in an inexact computation affecting only the outputs of the same columns, so the extension of inexact computation to a systolic array can also be performed with very limited error. The discrete cosine transform as application of the proposed inexact systolic arrays, is evaluated; simulation results show that the proposed inexact array is very effective, incurring in a small error.

/pdf/matrix-multiplication-by-an-inexact-systolic-array-wuk7ege9ub.pdf

Matrix multiplication by an inexact systolic array

This manuscript proposes non-binary orthogonal Latin square (OLS) codes that are amenable to a multilevel phase change memory (PCM). This is based on the property that the proposed ( n symbols, k symbols) t -symbol error correcting code uses the same H matrix as an ( n bits, k bits) binary t -bit error correcting OLS code. The new codes are shown to have a shorter check bit length and better probability in encoding/decoding than conventional binary OLS codes. Extensive results are provided for assessment and comparison. The proposed codes are also shown to be always better than the matrix codes, i.e. independently of the metric and the parameters employed in the comparison.

Non-Binary Orthogonal Latin Square Codes for a Multilevel Phase Charge Memory (PCM)

This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in automatic test equipment (ATE). The separate components are analyzed individually and then combined using Matlab. The Matlab simulation shows how jitter components combine and how the total jitter depends on the jitter injection sequence. The relationship among jitter components is presented and the superposition of the jitter components is verified. This new technique gives test engineers an insight into how the jitter components interact.

Fabrizio Lombardi

Papers

Energy Analysis of QCA Circuits for Reversible Computing

Using data compression in automatic test equipment for system-on-chip testing

Matrix multiplication by an inexact systolic array

Non-Binary Orthogonal Latin Square Codes for a Multilevel Phase Charge Memory (PCM)

On the modeling and analysis of jitter in ATE using Matlab