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Robert A. Reed
Researcher at Vanderbilt University
Publications - 406
Citations - 9511
Robert A. Reed is an academic researcher from Vanderbilt University. The author has contributed to research in topics: Single event upset & Monte Carlo method. The author has an hindex of 48, co-authored 392 publications receiving 8571 citations. Previous affiliations of Robert A. Reed include United States Naval Research Laboratory & Goddard Space Flight Center.
Papers
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Journal ArticleDOI
Monte Carlo Simulation of Single Event Effects
Robert A. Weller,Marcus H. Mendenhall,Robert A. Reed,Ronald D. Schrimpf,Kevin M. Warren,Brian D. Sierawski,Lloyd W. Massengill +6 more
TL;DR: In this paper, a Monte Carlo approach for estimating the frequency and character of single event effects based on a combination of physical modeling of discrete radiation events, device simulations to estimate charge transport and collection, and circuit simulations to determine the effect of the collected charge.
Journal ArticleDOI
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
Brian D. Sierawski,Jonathan A. Pellish,Robert A. Reed,Ronald D. Schrimpf,Kevin M. Warren,Robert A. Weller,Marcus H. Mendenhall,Jeffrey D. Black,A. D. Tipton,M.A. Xapsos,Robert Baumann,Xiaowei Deng,Michael J. Campola,M. Friendlich,Hak Kim,Anthony M. Phan,Christina Seidleck +16 more
TL;DR: In this paper, direct ionization from low energy protons is shown to cause upsets in a 65-nm bulk CMOS SRAM, consistent with results reported for other deep submicron technologies.
Journal ArticleDOI
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
Kevin M. Warren,Robert A. Weller,Marcus H. Mendenhall,Robert A. Reed,Dennis R. Ball,C.L. Howe,B.D. Olson,Michael L. Alles,Lloyd W. Massengill,Ronald D. Schrimpf,Nadim F. Haddad,S.E. Doyle,Dale McMorrow,Joseph S. Melinger,W.T. Lotshaw +14 more
TL;DR: In this article, a Geant4-based Monte-Carlo transport code was used to simulate heavy ion irradiation using a SEU hardened SRAM and the results showed that materials external to the sensitive volume can affect the experimentally measured cross-section curve.
Journal ArticleDOI
Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits
Paul E. Dodd,J.R. Schwank,Marty R. Shaneyfelt,J.A. Felix,P. Paillet,V. Ferlet-Cavrois,J. Baggio,Robert A. Reed,Kevin M. Warren,Robert A. Weller,Ronald D. Schrimpf,G.L. Hash,Scott M. Dalton,Kazuyuki Hirose,Hirobumi Saito +14 more
TL;DR: In this paper, the effects of heavy ion energy and nuclear interactions on the single-event upset (SEU) and single event latchup (SEL) response of commercial and radiation-hardened ICs are explored.
Journal ArticleDOI
Impact of Ion Energy and Species on Single Event Effects Analysis
Robert A. Reed,Robert A. Weller,Marcus H. Mendenhall,Jean-Marie Lauenstein,Kevin M. Warren,Jonathan A. Pellish,Ronald D. Schrimpf,Brian D. Sierawski,Lloyd W. Massengill,Paul E. Dodd,Marty R. Shaneyfelt,J.A. Felix,J.R. Schwank,Nadim F. Haddad,Reed K. Lawrence,J.H. Bowman,R. Conde +16 more
TL;DR: In this paper, Monte-Carlo simulations for several technologies have been used to predict the SEE response to irradiation in the absence of detailed information about the device geometry and fabrication process.