Elucidation and Identification of Double-Tip Effects in Atomic Force Microscopy Studies of Biological Structures
TLDR
The results can serve as a foundation to design computer-based automatic detection of double-tip AFM images during nanoscale measuring and imaging of biomolecules and even non-biological materials or structures, and then personal experience is not needed any longer to evaluate artifactual images induced by the double- Tip/probe effect.Abstract:
While atomic force microscopy (AFM) has been increasingly applied to life science, artifactual measurements or images can occur during nanoscale analyses of cell components and biomolecules. Tip-sample convolution effect is the most common mechanism responsible for causing artifacts. Some deconvolution-based methods or algorithms have been developed to reconstruct the specimen surface or the tip geometry. Double-tip or double-probe effect can also induce artifactual images by a different mechanism from that of convolution effect. However, an objective method for identifying the double-tip/probe-induced artifactual images is still absent. To fill this important gap, we made use of our expertise of AFM to analyze artifactual double-tip images of cell structures and biomolecules, such as linear DNA, during AFM scanning and imaging. Mathematical models were then generated to elucidate the artifactual double-tip effects and images develop during AFM imaging of cell structures and biomolecules. Based on these models, computational formulas were created to measure and identify potential double-tip AFM images. Such formulas proved to be useful for identification of double-tip images of cell structures and DNA molecules. The present studies provide a useful methodology to evaluate double-tip effects and images. Our results can serve as a foundation to design computer-based automatic detection of double-tip AFM images during nanoscale measuring and imaging of biomolecules and even non-biological materials or structures, and then personal experience is not needed any longer to evaluate artifactual images induced by the double-tip/probe effect.read more
Citations
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Double-Tip Artifact Removal From Atomic Force Microscopy Images
Yun-feng Wang,Jason I. Kilpatrick,Suzanne P. Jarvis,Francis M. Boland,Anil Kokaram,David Corrigan +5 more
TL;DR: This work applies a novel deblurring technique, using a Bayesian framework, to yield a reliable estimation of the real surface topography without any prior knowledge of the tip geometry (blind reconstruction), and focuses specifically on the double-tip effect.
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End-to-end differentiable blind tip reconstruction for noisy atomic force microscopy images
TL;DR: Differentiable blind tip reconstruction (DTR) as mentioned in this paper is an alternative to the BTR algorithm that estimates tip shape only from high-speed atomic force microscopy images using mathematical morphology operators.
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Spatiotemporal resolution in high-speed atomic force microscopy for studying biological macromolecules in action
TL;DR: In this paper , the authors explain the principle of high-speed atomic force microscopy (HS-AFM) and describe how the resolution is determined, and discuss recent attempts to improve the resolution of HS-AFMs to further extend the observable range of biological phenomena.
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David Keller,Chou Chih-Chung +1 more
TL;DR: In this paper, the authors used the electron beam of a scanning electron microscope (SEM) to deposit thin carbon microtips on the end of commercially available silicon nitride SFM cantilevers.