Grating Interrogations: from Small to Large Strain Measurement

TLDR: In this article, the authors used a Fourier transform to characterize a cross grating marked on the surface of a specimen using a master grid and applied it to the analysis of the grating.

Abstract: Our purpose is the direct strain measurement from the interrogation of a crossed grating marked on the surface of a specimen. The observation of the object through a master grid (as in moire method) is replaced by a direct characterization of the pattern using a Fourier transform. This gives direct access to the modification of the pitches which leads to quantification of the strain without the intermediary of a fringe pattern. The comparison between the undeformed and deformed states allows the determination of the magnitude and orientation of principal strains and of the local rigid-body rotation. We describe three analysis techniques, one using the diffraction phenomenon, another utilizing a numerical spectral evaluation and third combining diffraction and phase-shifting procedure. These grid interrogations have different domains of application and a suitable choice of these analysis techniques allows a very large measurement range (10−5 to high strain according to the grating resistance).