Microwave Measurements Part II Non-linear Measurements

TLDR: In this paper, the authors briefly review the concept and need for measurements of scattering parameters, and describe the two key instruments for microwave measurements: VNAs and spectrum analyzers, respectively.

Abstract: By convention, radio frequency (RF) and microwave frequencies range between 30 MHz and 300 GHz. Conversely, this means their wavelengths range between 10 m and 1 mm. Intense research in radar development during World War II extended the RF spectrum beyond the usual applications in radio communications. The use of shorter wavelengths resulted in laboratory equipment with proportionally smaller dimensions to generate, convey, transmit, and detect higher-frequency signals. Wavelengths shorter than 1 mm require equipment too small to be realized. Voltage, current, and impedance concepts lose their conventional meanings when the operating wavelength is approximately equal to the dimensions of the structures under test. The behavior of propagating electromagnetic waves must then be analyzed in terms of electric and magnetic field. Unfortunately, no simple and direct way exists to measure these quantities, so we must resort to indirect methods. In the following sections, we briefly review the concept and need for measurements of scattering parameters. We also describe the two key instruments for microwave measurements: VNAs and spectrum analyzers.