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Physico-mechanical characterisation of cells using atomic force microscopy - Current research and methodologies.

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TLDR
This review aims to provide an update on the AFM techniques currently used in cell biology studies, along with a description of the range of recently developed research methodologies in which AFM plays a key role.
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This article is published in Journal of Microbiological Methods.The article was published on 2011-08-01. It has received 68 citations till now. The article focuses on the topics: Force spectroscopy.

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Surface topographical factors influencing bacterial attachment

TL;DR: An outline of the suite of roughness characterization parameters that are available for the comprehensive description of the surface architecture of a substratum is presented, and a set of topographical parameters is proposed as a new standard for surface Roughness characterization in bacterial adhesion studies to improve the likelihood of identifying direct relationships between substratum topography and the extent of bacterial ad cohesion.
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An insight on bacterial cellular targets of photodynamic inactivation.

TL;DR: This review addresses the interactions between photosensitizers and bacterial cells, the ultrastructural, morphological and functional changes observed at initial stages and during the course of photodynamic inactivation, the oxidative alterations in specific molecular targets, and a possible development of resistance.
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Separation, characterization and identification of microplastics and nanoplastics in the environment.

TL;DR: This critical review elaborates the principles and applications of diverse analytical instruments or techniques for separation, characterization and quantification of MPs in the environment and highlights emerging and promising characterization techniques that may have been overlooked by research communities to study MPs.
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Linking environmental processes to the in situ functioning of microorganisms by high-resolution secondary ion mass spectrometry (NanoSIMS) and scanning transmission X-ray microscopy (STXM)

TL;DR: The technical capabilities and limitations of high-resolution secondary ion mass spectrometry (NanoSIMS) and scanning transmission (soft) X-ray microscopy (STXM) are reviewed and the combined use of both techniques are proposed and the technical challenges of their joint application are discussed.
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Recent advances in mechanical characterisation of biofilm and their significance for material modelling

TL;DR: In the present paper the existing experimental methods that have been proposed since the 1980s are reviewed and critically discussed with respect to their usefulness and applicability to develop numerical modelling approaches.
References
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Atomic force microscope

TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
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Force measurements with the atomic force microscope: Technique, interpretation and applications

TL;DR: The atomic force microscope (AFM) is not only used to image the topography of solid surfaces at high resolution but also to measure force-versus-distance curves as discussed by the authors, which provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities.
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Advances in atomic force microscopy

TL;DR: The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation AFM (FM-AFM), as well as other dynamic methods as discussed by the authors.
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Dynamic atomic force microscopy methods

TL;DR: In this paper, the authors review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods and present a detailed quantitative comparison between theoretical simulations and experiment.
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The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

TL;DR: Imaging of molecules with unprecedented atomic resolution is demonstrated by probing the short-range chemical forces with use of noncontact atomic force microscopy, and shows that Pauli repulsion is the source of the atomic resolution, whereas van der Waals and electrostatic forces only add a diffuse attractive background.
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