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Practical surface analysis: By auger and x-ray photoelectron spectroscopy
David Briggs,M. P. Seah +1 more
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The article was published on 1983-01-01 and is currently open access. It has received 4689 citations till now. The article focuses on the topics: Auger electron spectroscopy & X-ray photoelectron spectroscopy.read more
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X‐ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides
G. Deroubaix,Philippe Marcus +1 more
TL;DR: In this paper, various copper and zinc compounds have been synthesized and characterized by electron spectroscopy (XPS) and data on the 2p 3/2 levels of Cu, Zn and S, the 1s level of O, the L 3 M 45 M 45 Auger transitions of Cu and Zn, the valence bands and the modified Auger parameters are reported.
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Self assembled monolayers on silicon for molecular electronics.
TL;DR: An overview of various aspects of the self-assembly of organic monolayers on silicon substrates for molecular electronics applications and the concepts and realization of various molecular electronic components based on appropriate architecture of SAMs comprising of alkyl chains and conjugated molecules are presented.
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Structure and bonding environments at the calcite surface as observed with X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED)
TL;DR: In this paper, the exact electron binding energies for the atoms in calcite were determined with XPS using the gold dot method, and the results are 290.1 ± 0.1 eV for C1s, 347.7 and 351.2 ± 1.15 eV respectively.
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Evidence of Chemical Bonding at Biomaterial-Hard Tissue Interfaces:
Yasuhiro Yoshida,B. Van Meerbeek,Y. Nakayama,J. Snauwaert,L. Hellemans,Paul Lambrechts,Guido Vanherle,Kunio Wakasa +7 more
TL;DR: It is concluded that an ultrathin layer of a polyalkenoic acid can be prepared on a hydroxyapatite-based substrate by careful removal of non-bonded molecules.
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Probabilistic model for the simulation of secondary electron emission
Miguel A. Furman,M. T. F. Pivi +1 more
TL;DR: In this paper, a detailed description of a model and its computational algorithm for the secondary electron emission process is provided, which is based on a broad phenomenological fit to data for secondary-emission yield and the emitted-energy spectrum.