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Open AccessJournal Article

The Rietveld method

R. A. Young
- 01 Jan 1993 - 
- Vol. 30, Iss: 4
TLDR
In this paper, the early days of the Rietveld method are described, along with a retrospective view of its application in various areas of physics, such as X-ray and neutron analysis.
Abstract
Introduction to the Rietveld Method 1. The early days: a retrospective view 2. Mathematical aspects of Rietveld refinement 3. The flow of radiation in a polycrystalline material 4. Data collection strategies: fitting the experiment to the need 5. Background modelling in Rietveld analysis 6. Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis 7. Crystal imperfection broadening and peak shape in the Rietveld method 8. Bragg reflection profile shape in X-ray powder diffraction patterns 9. Restraints and constraints in Rietveld refinement 10. Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources 11. Combined X-ray and neutron Rietveld refinement 12. Rietveld analysis programs Rietan and Premos and special applications 13. Position - constrained and unconstrained powder-pattern-decomposition methods 14. Ab initio structure solutions with powder diffraction data

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Characterization of crystalline structure of ball-milled nano-Ni-Zn-ferrite by rietveld method

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Decoding crystallography from high-resolution electron imaging and diffraction datasets with deep learning

TL;DR: A convolutional neural network model was developed for reliable classification of crystal structures from small numbers of electron images and diffraction patterns with no preferred orientation and it narrows down the space groups to the top two with over 70% confidence in the worst case and up to 95% in the common cases.