H
Hoi Sing Kwok
Researcher at Hong Kong University of Science and Technology
Publications - 1207
Citations - 32982
Hoi Sing Kwok is an academic researcher from Hong Kong University of Science and Technology. The author has contributed to research in topics: Liquid crystal & Thin-film transistor. The author has an hindex of 77, co-authored 1165 publications receiving 29448 citations. Previous affiliations of Hoi Sing Kwok include University of Hong Kong & University of California, Berkeley.
Papers
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Journal ArticleDOI
Fluorinated indium-gallium-zinc oxide thin-film transistor with reduced vulnerability to hydrogen-induced degradation
Proceedings ArticleDOI
Switching behavior in bistable twisted nematic liquid crystal displays
TL;DR: In this paper, the authors investigate the switching bistability based on the interaction between dynamic flow and director rota-tion in twisted nematic liquid crystal cells and show that there exists a general type of bistable twisted director configurations.
Journal ArticleDOI
High‐Performance Polycrystalline Silicon Thin‐Film Transistors without Source/Drain Doping by Utilizing Anisotropic Conductivity of Bridged‐Grain Lines
Meng Zhang,Haotao Lin,Sunbin Deng,Rongsheng Chen,Guijun Li,Su-Ting Han,Ye Zhou,Yan Yan,Wei Zhou,Man Wong,Hoi Sing Kwok +10 more
Patent
Reflective active matrix liquid crystal displays with mixed twisted nematic and birefringent modes
TL;DR: In this article, a generalized mixed twisted nematic/birefringent effect (MTB) mode was presented for reflective liquid crystal displays with only one polarizer, which encompasses all previously published reflective nematic liquid crystal display modes.
Journal ArticleDOI
“Driving”-Stress-Induced Degradation in Polycrystalline Silicon Thin-Film Transistors and Its Suppression by a Bridged-Grain Structure
TL;DR: In this article, the degradation of polycrystalline silicon (poly-Si) thin-film transistors (TFTs) under "driving" stress is characterized and analyzed for the first time.