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Institution

Ahi Evran University

EducationKırşehir, Turkey
About: Ahi Evran University is a education organization based out in Kırşehir, Turkey. It is known for research contribution in the topics: Density functional theory & Ab initio. The organization has 842 authors who have published 2270 publications receiving 21904 citations.


Papers
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Journal ArticleDOI
TL;DR: In this article, aryldisulfonamides were synthesized and characterized by FTIR, 1 H NMR, 13 C NMR and HETCOR, COSY, LC-MS and elemental analysis techniques.

21 citations

Journal ArticleDOI
TL;DR: In this article, self-consistent band calculations on four compounds of the L 1 2 structure are presented, and the elastic constants (C 11, C 12 and C 44 ) for ScX 3 (X=Ir, Pd, Pt and Pd) compounds are calculated using the energy-strain method.

21 citations

Journal ArticleDOI
TL;DR: In this article, an ab initio constant pressure technique is applied to study the pressure-induced phase transition in AlN and a first-order phase transformation from the wurtzite structure to a rocksalt structure is observed in the constant pressure simulations.

21 citations

Journal ArticleDOI
TL;DR: Type IIB muscle fiber numbers of Morkaraman sheep were higher than those of other breeds in LD muscle and the relationship with some meat quality traits in Longissimus dorsi and Semitendinosus muscles from lambs of some Turkish native sheep breeds was investigated.

21 citations

Journal ArticleDOI
TL;DR: In this article, a linear relation between the deformation potential and interface roughness (IFR) scattering is pointed out for the investigated samples, which may lead to a better understanding of the mechanism of IFR scattering.
Abstract: Hall effect measurements on unintentionally doped Al0.25Ga0.75N/GaN/AlN heterostructures grown by metal organic chemical vapor deposition (MOCVD) were carried out as a function of temperature (20–300 K) and magnetic field (0–1.4 T). Magnetic-field-dependent Hall data are analyzed using the quantitative mobility spectrum analysis (QMSA) technique. The QMSA technique successfully separated electrons in the 2D electron gas (2DEG) at the Al0.25Ga0.75N/GaN interface from other 2D and 3D conduction mechanisms of the samples. 2DEG mobilities, carrier densities and conductivities of the investigated samples are compared at room temperature and low temperature (20 K). For a detailed investigation of the 2DEG-related growth parameters, the scattering analyses of the extracted 2DEG were carried out for all of the samples. Using the results of the scattering analyses, the relation between the growth and scattering parameters was investigated. Increments in the interface roughness (IFR) are reported with the increased GaN buffer growth temperatures. In addition, a linear relation between the deformation potential and interface roughness (IFR) scattering is pointed out for the investigated samples, which may lead to a better understanding of the mechanism of IFR scattering.

21 citations


Authors

Showing all 905 results

NameH-indexPapersCitations
Mustafa Kurt381324293
Mecit Halil Oztop251041714
Erdal Eren23421913
Vagif S. Guliyev231622036
Abdullah Yildiz23901288
İlbilge Dökme21581416
Onder Onguru211061285
Galip Zihni Sanus20671175
Kasim Yildirim191231222
Serkan Demirci1842912
Hatice Rana Erdem18831231
Murat Durandurdu17991099
Yusuf Erdogdu1757865
Gokhan Surucu1772758
Atilla Icli1751722
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
202320
202264
2021288
2020321
2019288
2018224