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Journal ArticleDOI

Dimensional artefacts to achieve metrological traceability in advanced manufacturing

TLDR
Dimensional artefacts are examined, discussing their characteristics, availability and role in supporting production by establishing metrological traceability, and guidelines for their selection, use and development are provided.
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This article is published in CIRP Annals.The article was published on 2020-01-01. It has received 45 citations till now. The article focuses on the topics: Traceability & Advanced manufacturing.

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Citations
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Journal ArticleDOI

Metrological characteristics for the calibration of surface topography measuring instruments: a review

TL;DR: The development and use of an ISO standardised framework to allow calibration of surface topography measuring instruments and uncertainty estimation based on a fixed set of metrological characteristics is reviewed.
Journal ArticleDOI

Proposal of design rules for improving the accuracy of selective laser melting (SLM) manufacturing using benchmarks parts

TL;DR: In this paper , the authors used metrological test artefacts to evaluate the accuracy of the selective laser melting (SLM) manufacturing process in 17-4PH stainless steel.
Journal ArticleDOI

Detection and Classification of Aircraft Fixation Elements during Manufacturing Processes Using a Convolutional Neural Network

TL;DR: The results reveal that the machine learning paradigm based on a neural network in an industrial environment is capable of accurately and reliably estimating mechanical parameters to improve the performance and flexibility of advanced manufacturing processing of large parts with structural responsibility.
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Optical metrology for digital manufacturing: a review

TL;DR: In this article , a review of the state of the art in optical metrology is presented, highlighting the advantages and impacts of the integration of optical coordinate and surface texture measurement technologies in digital manufacturing processes.
Journal ArticleDOI

Dimensional verification of metal additively manufactured lattice structures by X-ray computed tomography: Use of a newly developed calibrated artefact to achieve metrological traceability

TL;DR: In this paper, a new reference object was designed, produced and calibrated to be similar to the investigated AM structures and to determine the task-specific uncertainty of CT-based dimensional measurements of lattice struts.
References
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Journal ArticleDOI

Folding DNA to create nanoscale shapes and patterns

TL;DR: This work describes a simple method for folding long, single-stranded DNA molecules into arbitrary two-dimensional shapes, which can be programmed to bear complex patterns such as words and images on their surfaces.
Journal ArticleDOI

A Cyber-Physical Systems architecture for Industry 4.0-based manufacturing systems

TL;DR: A unified 5-level architecture is proposed as a guideline for implementation of Cyber-Physical Systems (CPS), within which information from all related perspectives is closely monitored and synchronized between the physical factory floor and the cyber computational space.
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