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Journal ArticleDOI

Mixed host organic light-emitting devices with low driving voltage and long lifetime

Jiun-Haw Lee, +4 more
- 03 Mar 2005 - 
- Vol. 86, Iss: 10, pp 103506
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TLDR
In this paper, the authors presented and analyzed the performance of the mixed host organic light-emitting devices (OLEDs) with a high mobility electron ETL material, bis(10-hydroxybenzo[h]qinolinato)beryllium, and showed a brightness of 27600cd∕m2 at a driving voltage of 5 V.
Abstract
In this letter, we present and analyze the device performance of the mixed host (MH) organic light-emitting devices (OLEDs). The host of the emitting layer (EML) material in this device consists of a hole transport layer (HTL) and an electron transport layer (ETL) fabricated by coevaporation. The bipolar transport characteristic of the MH layer helps to reduce the driving voltage. Device lifetime is increased due to the elimination of the sharp boundary of the HTL/EML interface. Combining the MH structure with a high mobility electron ETL material, bis(10-hydroxybenzo[h]qinolinato)beryllium, the OLED has shown a brightness of 27600cd∕m2 at a driving voltage of 5 V, and a lifetime four times longer than that of a conventional OLED.

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Citations
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Journal ArticleDOI

Approaches for fabricating high efficiency organic light emitting diodes

TL;DR: In this article, the efficiency records of OLED devices using fluorescent, phosphorescent, and thermally activated delay fluorescent materials are summarized and a review of all the available efficiency-effective device architectural approaches, which include using thin layer structures, low carrier injection barriers, high carrier mobility, balanced carrier injection, effective carrier confinement, effective host-to-guest energy transfer, effective recombination zone, effective exciton generation on the host and p-i-n structures, and tandem structures.
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Al2O3/ZrO2 Nanolaminates as Ultrahigh Gas-Diffusion Barriers—A Strategy for Reliable Encapsulation of Organic Electronics

TL;DR: In this article, the authors report on thin encapsulation layers prepared by ALD at a temperature of 80 8C, and introduce novel highly efficient permeation barriers based on so-called nanolaminate structures.
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Long-lived efficient delayed fluorescence organic light-emitting diodes using n-type hosts

TL;DR: It is demonstrated that electron-transporting n-type hosts, which typically include an acceptor moiety in their chemical structure, have the intrinsic ability to balance the charge fluxes and broaden the recombination zone in delayed fluorescence organic electroluminescent devices, while at the same time preventing the formation of high-energy excitons.
Journal ArticleDOI

Hydroxynaphthyridine-derived group III metal chelates: wide band gap and deep blue analogues of green Alq3 (tris(8-hydroxyquinolate)aluminum) and their versatile applications for organic light-emitting diodes.

TL;DR: It is successfully demonstrated that the application of these unusual hydroxynaphthyridine metal chelates can be very versatile and effective and solved or alleviated the problem of exciplex formation that took place between the hole-transporting layer and hydroxynthetic metalChelates, of which OLED application has been prohibited to date.
References
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Journal ArticleDOI

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TL;DR: In this article, the authors investigated the properties of single and hetero-layer organic light-emitting diodes based on aromatic amines and showed that the thickness dependence of the currentvoltage (I-V) characteristics provides a unique criterion to discriminate between (1) injection limited behaviour, (2) trap-charge limited conduction with an exponential trap distribution and a fieldindependent mobility, and (3) trap free space-charge-limited conduction (SCLC) with a field and temperature dependent mobility.
Journal ArticleDOI

Nonradiative recombination centers and electrical aging of organic light-emitting diodes: Direct connection between accumulation of trapped charge and luminance loss

TL;DR: In this paper, the authors find that the decreasing luminance efficiency is linearly correlated with an accumulation of immobile positive charge at the HTL|ETL interface, and the magnitude of the charge is comparable to the total charge at that interface when an unaged device is operated.
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