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X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface
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TLDR
In this paper, the details of the interface region of a molecular beam epitaxially grown Al single crystal on a single-crystal substrate were studied using X-ray diffraction and total external reflection.Abstract:
A new technique utilizing conventional x‐ray diffraction in conjunction with total external reflection has provided a powerful tool for studying ordered interfaces and surface phenomena. It has been used in this work to study the details of the interface region of a molecular beam epitaxially grown Al single crystal on a molecular beam epitaxially grown GaAs single‐crystal substrate. A simple model including variations of the lattice parameter and disorder in the interface region is in agreement with these experimental results.read more
Citations
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Novel GIX2 Apparatus for Thin Film Analysis Using Color Laue Method
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Structural characterization of La0.9Ba0.1MnO3/Y-ZrO2 film by X-ray diffraction
TL;DR: In this paper, perovskite manganite La0.9Ba0.1MnO3 (LBMO) films were deposited on (0,0,1)-oriented single crystal yttria-stabilized zirconia (YSZ) substrate by 90° off-axis radio frequency magnetron sputtering.
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High-resolution X-ray optics for third-generation synchrotron radiation
TL;DR: In this article, high-resolution X-ray optics for the use of the extremely high brilliance of the undulator X-radiation from the third-generation synchrotron light sources are presented.
Journal ArticleDOI
Specular reflection of X-rays under the conditions of grazing diffraction in a crystal with an amorphous surface layer
TL;DR: In this paper, the anomalous angular dependence of the specular reflection intensity under the condition of non-coplanar grazing X-ray diffraction in a crystal coated with an amorphous surface film was revealed and studied experimentally.
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Residual stress study of nanostructured zirconia films obtained by MOCVD and by sol–gel routes
TL;DR: The residual stress study of nanostructured zirconia films obtained by two deposition techniques, MOCVD and sol-gel used in this work, shows the advantages and limitations of each process as discussed by the authors.
References
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Book
The optical principles of the diffraction of x-rays.
TL;DR: In this paper, Bragg et al. describe the Optik der R6ntgenstrahlen in Raumgitter and leitet damit fiber zu den experimentellen Methoden and Ergebn]ssen, die den folgenden B~nden vorbehalten bleiben.
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CXVII. The total reflexion of X-rays
TL;DR: In this article, the total reflexion of X-rays was studied and it was shown that X-ray can be interpreted as a measure of the amount of radiation absorbed by the human body.
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Single‐crystal‐aluminum Schottky‐barrier diodes prepared by molecular‐beam epitaxy (MBE) on GaAs
A. Y. Cho,P. D. Dernier +1 more
TL;DR: In this paper, the metal-semiconductor surface barriers were formed by epitaxially grown Al(001) on GaAs (001) with MBE at room temperature.