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Journal ArticleDOI

X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface

W. C. Marra, +2 more
- 01 Nov 1979 - 
- Vol. 50, Iss: 11, pp 6927-6933
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TLDR
In this paper, the details of the interface region of a molecular beam epitaxially grown Al single crystal on a single-crystal substrate were studied using X-ray diffraction and total external reflection.
Abstract
A new technique utilizing conventional x‐ray diffraction in conjunction with total external reflection has provided a powerful tool for studying ordered interfaces and surface phenomena. It has been used in this work to study the details of the interface region of a molecular beam epitaxially grown Al single crystal on a molecular beam epitaxially grown GaAs single‐crystal substrate. A simple model including variations of the lattice parameter and disorder in the interface region is in agreement with these experimental results.

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Citations
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Journal ArticleDOI

Smaller is faster and more sensitive: the effect of wire size on the detection of hydrogen by single palladium nanowires.

TL;DR: It is concluded that the kinetics of hydrogen adsorption limits the observed response rate seen for the nanowire, and that hydrogen desorption from thenanowire limits the observation recovery rate; proton diffusion within PdHx does not limit the rates of either of these processes.
Journal ArticleDOI

Surface characterization of sulfur and alkanethiol self-assembled monolayers on Au(111)

TL;DR: In this paper, the atomic/molecular structures of S-containing alkanethiol self-assembled monolayers (SAMs) on Au(111) have been studied.
Journal ArticleDOI

Growth of epitaxial graphene: Theory and experiment

TL;DR: A detailed review of the literature for the last 5-10 years on epitaxial growth of graphene is presented in this article, where both experimental and theoretical aspects related to growth on transition metals and on silicon carbide are thoroughly reviewed.
Journal ArticleDOI

Scattering of X-rays and neutrons at interfaces

TL;DR: In this paper, a general expression for the kinematic scattering cross-section of X-rays and neutrons impinging on an arbitrary interfacial structure is derived based on the distorted wave Born approximation.
Book ChapterDOI

Extended X-Ray Absorption Fine Structure Spectroscopy

TL;DR: Extended x-ray absorption fine structure spectroscopy (EXAFS) as discussed by the authors is a widely used technique in condensed matter physics, where it has been applied in a wide variety of applications.
References
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Book

The optical principles of the diffraction of x-rays.

TL;DR: In this paper, Bragg et al. describe the Optik der R6ntgenstrahlen in Raumgitter and leitet damit fiber zu den experimentellen Methoden and Ergebn]ssen, die den folgenden B~nden vorbehalten bleiben.
Book

Physics of Semiconductors

John L. Moll
Journal ArticleDOI

CXVII. The total reflexion of X-rays

TL;DR: In this article, the total reflexion of X-rays was studied and it was shown that X-ray can be interpreted as a measure of the amount of radiation absorbed by the human body.
Journal ArticleDOI

Single‐crystal‐aluminum Schottky‐barrier diodes prepared by molecular‐beam epitaxy (MBE) on GaAs

TL;DR: In this paper, the metal-semiconductor surface barriers were formed by epitaxially grown Al(001) on GaAs (001) with MBE at room temperature.