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X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface
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TLDR
In this paper, the details of the interface region of a molecular beam epitaxially grown Al single crystal on a single-crystal substrate were studied using X-ray diffraction and total external reflection.Abstract:
A new technique utilizing conventional x‐ray diffraction in conjunction with total external reflection has provided a powerful tool for studying ordered interfaces and surface phenomena. It has been used in this work to study the details of the interface region of a molecular beam epitaxially grown Al single crystal on a molecular beam epitaxially grown GaAs single‐crystal substrate. A simple model including variations of the lattice parameter and disorder in the interface region is in agreement with these experimental results.read more
Citations
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Biological reduction of nanoengineered iron(III) oxide sculptured thin films.
Hui Tan,Obiefune K. Ezekoye,James Van Der Schalie,Mark W. Horn,Akhlesh Lakhtakia,Jian Xu,William D. Burgos +6 more
TL;DR: Results underscore the feasibility of an STF-based fiber optic iron(lll) reduction sensor for in situ subsurface deployment and determine that mineralogy of the film materials did not change, but surface roughness generally increased.
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Applications of synchrotron radiation in materials analysis
TL;DR: In this paper, the synchrotron radiation (SR) emitted by circulating high-energy electrons has extraordinary properties: the light is intensive and bright, it is tunable and highly collimated, and finally it is linearly polarized.
Journal ArticleDOI
High-resolution grazing-incidence x-ray diffraction for characterization of defects in crystal surface layers
TL;DR: In this paper, the peculiarities of high-resolution measurements in grazing-incidence diffraction (GID) are studied, both theoretically and experimentally, and it is shown that complete discrimination between coherent reflection and diffuse scattering due to defects in GID requires a three-dimensional mapping of reciprocal space.
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Total Reflection X-ray Fluorescence Spectrometry
Kazuo Taniguchi,Toshio Ninomiya +1 more
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Synchrotron X-ray diffraction study of an interfacial super-structure: a-si on Ge0.2Si0.8 (111)-5 × 5
TL;DR: In this article, the interfacial structure between amorphous Si (a-Si) and Ge 0.2 Si 0.8 /Si(111) was investigated by grazing incidence X-ray diffraction with the use of a synchroton radiation Xray source.
References
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Book
The optical principles of the diffraction of x-rays.
TL;DR: In this paper, Bragg et al. describe the Optik der R6ntgenstrahlen in Raumgitter and leitet damit fiber zu den experimentellen Methoden and Ergebn]ssen, die den folgenden B~nden vorbehalten bleiben.
Journal ArticleDOI
CXVII. The total reflexion of X-rays
TL;DR: In this article, the total reflexion of X-rays was studied and it was shown that X-ray can be interpreted as a measure of the amount of radiation absorbed by the human body.
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Single‐crystal‐aluminum Schottky‐barrier diodes prepared by molecular‐beam epitaxy (MBE) on GaAs
A. Y. Cho,P. D. Dernier +1 more
TL;DR: In this paper, the metal-semiconductor surface barriers were formed by epitaxially grown Al(001) on GaAs (001) with MBE at room temperature.