Z
Zhifeng Ren
Researcher at Texas Center for Superconductivity
Publications - 726
Citations - 84970
Zhifeng Ren is an academic researcher from Texas Center for Superconductivity. The author has contributed to research in topics: Thermoelectric effect & Thermoelectric materials. The author has an hindex of 122, co-authored 695 publications receiving 71212 citations. Previous affiliations of Zhifeng Ren include Massachusetts Institute of Technology & University of Cincinnati.
Papers
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Journal ArticleDOI
Thermal stability of thermoelectric materials via in situ resistivity measurements.
TL;DR: An experimental setup for determining the electrical resistivity of several types of thermoelectric materials over the temperature range 20 < T < 550 °C is described in detail and Measurements made during temperature cycling show an irreversible decrease in the electricalresistivity of Cu(0.01)Bi(2)Te(2.7)Se( 0.3) when the measuring temperature exceeds the maximum sample fabrication temperature.
Patent
Nbfesb-based half-heusler thermoelectric materials and methods of fabrication and use
Boris Kozinsky,Giri Joshi,Jian Yang,Michael Engber,Tej Pantha,Martin Cleary,Zhifeng Ren,Ran He +7 more
TL;DR: In this article, a thermoelectric half-Heusler material comprising at least niobium (Nb), iron (Fe), and antimony (Sb) grains with a mean grain size less than one micron is proposed.
Heavy Doping and Band Engineering by Potassium to Improve the Thermoelectric Figure of Merit in p-Type PbTe, PbSe, and PbTe[subscript 1– y]Se[subscript y]
Qian Zhang,Feng Cao,Weishu Liu,Kevin Lukas,Bo Yu,Shuo Chen,Cyril Opeil,David Broido,Gang Chen,Zhifeng Ren +9 more
Journal ArticleDOI
Effect of nucleation sites on the growth and quality of single-crystal boron arsenide
TL;DR: In this article, a 7mm-long BAs single crystal was grown on nucleation sites of different compositions using the chemical vapor transport method by applying an additional nucleation site.
Proceedings ArticleDOI
Using carbon nanotube cantilevers in scanning probe metrology
Rudy Schlaf,Yusuf Emirov,J A. Bieber,A. K. Sikder,J. Kohlscheen,Deron A. Walters,Mohammed R. Islam,Bhavik Metha,Zhifeng Ren,Terri L. Shofner,Benjamin B. Rossie,Michael W. Cresswell +11 more
TL;DR: In this paper, the attachment angle of carbon nanotubes with respect to the cantilever beam is shown to be crucial for their application in high aspect ratio critical dimension metrology (CDM), where the CNT probes generally appear to be long lasting, but the manufacture of precisely aligned CNT of defined length, diameter and number of walls poses a number of challenges.