Atomic force microscope
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TLDR
The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.Abstract:
The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A.read more
Citations
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Journal ArticleDOI
Modelling and Nanoscale Force Spectroscopy of Frequency Modulation Atomic Force Microscopy
TL;DR: In this paper, a simulation model for frequency modulation atomic force microscopy (FM-AFM) operating in constant amplitude dynamic mode is presented based on the slow time varying function theory.
Proceedings ArticleDOI
Fabrication of novel cantilever with nanotip for AFM applications
TL;DR: In this paper, a Poly-Si cantilever with enhanced high-aspect-ratio nanotips is proposed to be used in the atomic force microscopy (AFM).
Book ChapterDOI
Characterization of Membranes
TL;DR: In this article, the authors proposed a characterization method for gas transport through polymers that is non-destructive, accurate, repeatable, and fast and should maximize data, which can be classified according to the physical mechanisms they exploit.
Book ChapterDOI
Electrochemical Friction Force Microscopy
Florian Hausen,Florian Hausen +1 more
TL;DR: In this paper, the use of established electrochemical methods to control surface chemistry and how this affects tribological properties is discussed, as friction and wear is strongly affected by the chemical nature of the interacting surfaces electrochemistry plays an important role in tribology.
DissertationDOI
Elastomer degradation in water utility systems via loss of carbon black observed with atomic force microscopy
TL;DR: In this article, the authors used phase images produced by atomic force microscopy (AFM) to investigate the modes of attack by monochloramines on the rubber parts and found that carbon black is also known to add strength and durability to the elastomer.
References
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Journal ArticleDOI
Surface studies by scanning tunneling microscopy
TL;DR: In this paper, surface microscopy using vacuum tunneling has been demonstrated for the first time, and topographic pictures of surfaces on an atomic scale have been obtained for CaIrSn 4 and Au.
Journal ArticleDOI
Silicon as a mechanical material
TL;DR: This review describes the advantages of employing silicon as a mechanical material, the relevant mechanical characteristics of silicon, and the processing techniques which are specific to micromechanical structures.
PatentDOI
Scanning capacitance microscope
TL;DR: In this article, a scanning capacitance probe is used to identify the topography and material properties of the surface layer of a human body in microscopic imaging using a single image of the body.