Atomic force microscope
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TLDR
The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.Abstract:
The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A.read more
Citations
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Atomic-scale friction of a tungsten tip on a graphite surface.
TL;DR: Using an atomic force microscope, atomic-scale features on the frictional force acting on a tungsten wire tip sliding on the basal plane of a graphite surface at low loads are observed.
Journal ArticleDOI
Calculation of thermal noise in atomic force microscopy
Hans-Jürgen Butt,Manfred Jaschke +1 more
TL;DR: In this paper, the authors calculated the thermal noise of a cantilever with a free end by considering all possible vibration modes of the cantilevers and showed that if the end is supported by a hard surface, no thermal fluctuations of the deflection are possible.
Journal ArticleDOI
Direct observation of the nanoscale dynamics of membrane lipids in a living cell
Christian Eggeling,Christian Ringemann,Rebecca Medda,Günter Schwarzmann,Konrad Sandhoff,Svetlana Polyakova,Vladimir N. Belov,Birka Hein,Claas von Middendorff,Andreas Schönle,Stefan W. Hell +10 more
TL;DR: The ability of stimulated emission depletion (STED) far-field fluorescence nanoscopy to detect single diffusing (lipid) molecules in nanosized areas in the plasma membrane of living cells is demonstrated.
Book
Introduction to Scanning Tunneling Microscopy
TL;DR: In this paper, the authors present an overview of the imaging mechanism for tunneling, including tip-sample interactions and tip treatment, and a detailed description of the tunneling matrix elements.
Journal ArticleDOI
Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
TL;DR: In this paper, a modified version of the atomic force microscope is introduced that enables a precise measurement of the force between a tip and a sample over a tip-sample distance range of 30-150 A.
References
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Journal ArticleDOI
Surface studies by scanning tunneling microscopy
TL;DR: In this paper, surface microscopy using vacuum tunneling has been demonstrated for the first time, and topographic pictures of surfaces on an atomic scale have been obtained for CaIrSn 4 and Au.
Journal ArticleDOI
Silicon as a mechanical material
TL;DR: This review describes the advantages of employing silicon as a mechanical material, the relevant mechanical characteristics of silicon, and the processing techniques which are specific to micromechanical structures.
PatentDOI
Scanning capacitance microscope
TL;DR: In this article, a scanning capacitance probe is used to identify the topography and material properties of the surface layer of a human body in microscopic imaging using a single image of the body.