Atomic force microscope
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TLDR
The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.Abstract:
The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A.read more
Citations
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Nanotribology: friction, wear and lubrication at the atomic scale
TL;DR: In this paper, an understanding of the molecular mechanisms of tribology in thin films and at surfaces has been presented, which is of fundamental importance in many pure and applied sciences, such as computer simulations.
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Covalently functionalized nanotubes as nanometre- sized probes in chemistry and biology
Stanislaus S. Wong,Ernesto Joselevich,Adam T. Woolley,Chin Li "Barry" Cheung,Charles M. Lieber +4 more
TL;DR: In this paper, the authors demonstrate that nanotube tips with the capability of chemical and biological discrimination can be created with acidic functionality and by coupling basic or hydrophobic functionalities or biomolecular probes to the carboxyl groups that are present at the open tip ends.
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Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope
TL;DR: In this article, a detailed theoretical analysis of the frequency response of a cantilever beam that is immersed in a viscous fluid and excited by an arbitrary driving force is presented.
Journal ArticleDOI
Probing the Relation Between Force—Lifetime—and Chemistry in Single Molecular Bonds
TL;DR: The method of dynamic force spectroscopy (DFS) is being used to probe the complex relation between force-lifetime-and chemistry in single molecular bonds, and probes the inner world of molecular interactions to reveal barriers that are difficult or impossible to detect in assays of near equilibrium dissociation but that determine bond lifetime and strength under rapid detachment.
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Novel optical approach to atomic force microscopy
Gerhard Meyer,Nabil M. Amer +1 more
TL;DR: In this article, a simple optical method for detecting the cantilever deflection in atomic force microscopy is described, and the method is incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, are successfully performed.
References
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Surface studies by scanning tunneling microscopy
TL;DR: In this paper, surface microscopy using vacuum tunneling has been demonstrated for the first time, and topographic pictures of surfaces on an atomic scale have been obtained for CaIrSn 4 and Au.
Journal ArticleDOI
Silicon as a mechanical material
TL;DR: This review describes the advantages of employing silicon as a mechanical material, the relevant mechanical characteristics of silicon, and the processing techniques which are specific to micromechanical structures.
PatentDOI
Scanning capacitance microscope
TL;DR: In this article, a scanning capacitance probe is used to identify the topography and material properties of the surface layer of a human body in microscopic imaging using a single image of the body.