Journal ArticleDOI
Crystal sensor for microscopy applications
Zhiqiang Peng,Paul West +1 more
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TLDR
In this paper, a force sensor based on a quartz crystal was used for measuring nanoscale topographic images, which is a length-extensional mode oscillator with a resonant frequency of about 650 kHz.Abstract:
We report a force sensor based on a quartz crystal that is used for measuring nanoscale topographic images. The crystal is a length-extensional mode oscillator with a resonant frequency of about 650 kHz. Compared to 33 kHz tuning forks, such crystal sensors have a much higher resonance frequency, which allows for high force sensitivity and a fast response time. The crystal sensor is operated in the shear-force mode, with the probes vibrating parallel to the sample surface. The tip-sample interaction during operation is estimated to be less than 300 pN.read more
Citations
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Aspects of scanning force microscope probes and their effects on dimensional measurement
Andrew Yacoot,Ludger Koenders +1 more
TL;DR: In this article, the authors describe the various scanning probe microscopy tips and cantilevers used today for scanning force microscopy and magnetic force imaging, together with an overview of the various tip-sample interactions that affect dimensional measurements.
Journal ArticleDOI
Simultaneously measured signals in scanning probe microscopy with a needle sensor: frequency shift and tunneling current.
I. Morawski,Bert Voigtländer +1 more
TL;DR: Together noncontact scanning force microscopy and tunneling current images of a platinum(111) surface obtained by means of a 1 MHz quartz needle sensor reveals proportional-integral controller errorlike behavior, which is governed by the time derivative of the topography signal.
Journal ArticleDOI
Electroluminescence Mapping of CuGaSe2 Solar Cells by Atomic Force Microscopy
Manuel J. Romero,Chun-Sheng Jiang,J. Abushama,Helio R. Moutinho,Mowafak Al-Jassim,Rommel Noufi +5 more
TL;DR: In this paper, tuning-fork sensors were used to detect electroluminescence (EL) in CuGaSe2 solar cells during intermittent contact driven by an external bias applied to the conducting tip.
Journal ArticleDOI
A Transimpedance Amplifier for Remotely Located Quartz Tuning Forks
Ethan Kleinbaum,Gabor Csathy +1 more
TL;DR: A single stage low noise transimpedance amplifier with a bandwidth exceeding 1 MHz is presented and an in-depth analysis of the dependence of the amplifier parameters on the cable capacitance is provided.
Journal ArticleDOI
Note: A transimpedance amplifier for remotely located quartz tuning forks
Ethan Kleinbaum,Gabor Csathy +1 more
TL;DR: In this article, a single-stage low-noise transimpedance amplifier with a bandwidth exceeding 1 MHz is presented and an in-depth analysis of the dependence of the amplifier parameters on the cable capacitance is provided.
References
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Journal ArticleDOI
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
Book
Vibration problems in engineering
TL;DR: In this article, the Probleme dynamique and Vibration were used for propagation of ondes reference records created on 2004-09-07, modified on 2016-08-08.
Journal ArticleDOI
Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity
TL;DR: In this article, a frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum (<10−3 Torr).
Frequency modulation detection using highdkantilevers for enhanced force microscope sensitivity
T. R. Albrecht,D. Horne,D. Rugar +2 more
TL;DR: In this paper, a frequency modulation (FM) technique has been demonstrated which ennances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum ( < 10 ’ Torr).
Journal ArticleDOI
Novel optical approach to atomic force microscopy
Gerhard Meyer,Nabil M. Amer +1 more
TL;DR: In this article, a simple optical method for detecting the cantilever deflection in atomic force microscopy is described, and the method is incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, are successfully performed.