Journal ArticleDOI
Novel self-aligned top-gate oxide TFT for AMOLED displays
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TLDR
In this paper, a self-aligned top-gate oxide-semiconductor thin-film transistor (TFT) formed by using the aluminum reaction method has been developed, which has advantages such as small-sized TFTs, lower mask count, and small parasitic capacitance.Abstract:
— A novel highly reliable self-aligned top-gate oxide-semiconductor thin-film transistor (TFT) formed by using the aluminum (Al) reaction method has been developed. This TFT structure has advantages such as small-sized TFTs, lower mask count, and small parasitic capacitance. The TFT with a 4-μm channel length exhibited a field-effect mobility of 21.6 cm2/V-sec, a threshold voltage of −1.2 V, and a subthreshold swing of 0.12 V/decade. Highly reliable TFTs were obtained after 300°C annealing without increasing the sheet resistivity of the source/drain region. A 9.9-in.-diagonal qHD AMOLED display was demonstrated with self-aligned top-gate oxide-semiconductor TFTs for a low-cost and ultra-high-definition OLED display. Excellent brightness uniformity could be achieved due to small parasitic capacitance.read more
Citations
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Journal ArticleDOI
The development of flexible integrated circuits based on thin-film transistors
TL;DR: The potential of thin-film transistor technologies in the development of low-cost, flexible integrated circuits for applications beyond flat-panel displays, including the Internet of Things and lightweight wearable electronics is discussed and the concept of a Moore's law for flexible electronics is proposed.
Journal ArticleDOI
Recent progress in high performance and reliable n-type transition metal oxide-based thin film transistors
Jang Yeon Kwon,Jae Kyeong Jeong +1 more
TL;DR: In this article, a review of the recent progress in vacuum-based n-type transition metal oxide (TMO) thin film transistors (TFTs) is presented, and the effects of the TMO composition on the performance of the resulting oxide TFTs has been reviewed, and classified into binary, ternary and quaternary composition systems.
Journal ArticleDOI
An amorphous oxide semiconductor thin-film transistor route to oxide electronics
TL;DR: Amorphous oxide semiconductor (AOS) thin-film transistors (TFTs) invented only one decade ago are now being commercialized for active-matrix liquid crystal display (AMLCD) backplane applications.
Journal ArticleDOI
Oxide-TFT technologies for next-generation AMOLED displays
TL;DR: In this article, the status of oxide-TFT development and the issues for the mass-production of next-generation AMOLED displays are discussed, and three types of AMOLed displays using different oxide materials and TFT structures are demonstrated.
Journal ArticleDOI
Amorphous InGaZnO and metal oxide semiconductor devices: an overview and current status
J. G. Troughton,Del Atkinson +1 more
TL;DR: An overview of the history and development of metal oxide devices, from their earliest inception to the most recent advances, can be found in this article, with a discussion of the factors that need to be considered in designing metal oxide semiconducting devices, including material choice, deposition methods and device structure.
References
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Journal ArticleDOI
Improvements in the device characteristics of amorphous indium gallium zinc oxide thin-film transistors by Ar plasma treatment
TL;DR: The effect of Ar plasma treatment on amorphous indium gallium zinc oxide (a-IGZO) thin films was investigated in this paper, where the authors attempted to reduce the contact resistance between the Pt∕Ti (source/drain electrode) and a-IZO (channel).
Journal ArticleDOI
3.1: Distinguished Paper: 12.1-Inch WXGA AMOLED Display Driven by Indium-Gallium-Zinc Oxide TFTs Array
Jae Kyeong Jeong,Jong Han Jeong,Jong Hyun Choi,Jang Soon Im,Sung Ho Kim,Hui Won Yang,Ki Nyeng Kang,Kwang Suk Kim,Tae Kyung Ahn,Hyun-Joong Chung,Min-Kyu Kim,Bon Seog Gu,Jin-Seong Park,Yeon-Gon Mo,Hye-Dong Kim,Ho Kyoon Chung +15 more
TL;DR: In this paper, a 121-inch WXGA active-matrix organic light emitting diode (AMOLED) display was demonstrated using indium-gallium-zinc oxide (IGZO) thin-film transistors (TFTs) as an activematrix back plane.
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42.1: Invited Paper: Improved Amorphous In‐Ga‐Zn‐O TFTs
Ryo Hayashi,Ayumu Sato,Masato Ofuji,Katsumi Abe,Hisato Yabuta,Masafumi Sano,Hideya Kumomi,Kenji Nomura,Toshio Kamiya,Masahiro Hirano,Hideo Hosono +10 more
TL;DR: In this paper, the authors review the features of amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors, as well as circuit operation based on these TFTs.
Journal ArticleDOI
A new method to determine MOSFET channel length
TL;DR: Based on the linear region relationship between effective channel length L eff and channel resistance R chan of an MOS transistor, a new method was proposed to electrically determine the channel length with both accuracy and convenience as discussed by the authors.
Journal ArticleDOI
Comparison of the effects of Ar and H2 plasmas on the performance of homojunctioned amorphous indium gallium zinc oxide thin film transistors
TL;DR: In this article, a homojunctioned amorphous InGaZnO (a-IGZO) thin film transistor (TFT) was proposed and compared to that of a conventional structured TFT.