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Proceedings ArticleDOI

Optimization of VDD and VTH for low-power and high speed applications

K. Nose, +1 more
- pp 469-474
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TLDR
In this paper, closed-form formulas are presented for optimum supply voltage (VDD) and threshold voltage (VTH) that minimize power dissipation when technology parameters and required speed are given.
Abstract
Closed-form formulas are presented for optimum supply voltage (VDD) and threshold voltage (VTH) that minimize power dissipation when technology parameters and required speed are given. The formulas take into account short-channel effects and the variation of VTH and temperature. Using typical device parameters, it is shown that a simple guideline to optimize the power consumption is to set the ratio of maximum leakage power to total power about 30%. Extending the analysis, the future VLSI design trend is discussed. The optimum VDD coincides with the SIA roadmap and the optimum VTH for logic blocks at the highest temperature and at the lowest process variation corner is in the range of 0V~0.1V over generations.

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Citations
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Tunnel field-effect transistors as energy-efficient electronic switches

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Dark silicon and the end of multicore scaling

TL;DR: The study shows that regardless of chip organization and topology, multicore scaling is power limited to a degree not widely appreciated by the computing community.
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Modeling and sizing for minimum energy operation in subthreshold circuits

TL;DR: It is shown that minimum sized devices are theoretically optimal for reducing energy, and existing standard cell libraries offer a good solution for minimizing energy in subthreshold circuits.
Journal ArticleDOI

Ultralow-Power Design in Near-Threshold Region

TL;DR: This paper explores how design in the moderate inversion region helps to recover some of that lost performance, while staying quite close to the minimum-energy point, and introduces a pass-transistor based logic family that excels in this operational region.
Proceedings ArticleDOI

Scaling, power, and the future of CMOS

TL;DR: In this article, the authors briefly review the forces that caused the power problem, the solutions that were applied, and what the solutions tell us about the problem as systems became more power constrained, optimizing the power became more critical.
References
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Book

Fundamentals of Modern VLSI Devices

Yuan Taur, +1 more
TL;DR: In this article, the authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices.
Journal ArticleDOI

Alpha-power law MOSFET model and its applications to CMOS inverter delay and other formulas

TL;DR: In this paper, an alpha-power-law MOS model that includes the carrier velocity saturation effect, which becomes prominent in short-channel MOSFETs, is introduced and closed-form expressions for the delay, short-circuit power, and transition voltage of CMOS inverters are derived.
Journal ArticleDOI

Supply and threshold voltage scaling for low power CMOS

TL;DR: In this paper, the authors investigated the effect of reducing the supply and threshold voltage on the energy efficiency of CMOS circuits and showed that when the transistors are velocity saturated and the nodes have a high activity factor, this simple analysis suggests optimal energy efficiency at supply voltages under 0.5 V.
Journal Article

Ultra low power CMOS technology

TL;DR: The motivation, opportunities, and problems associated with implementing digital logic at very low voltages, including the challenge of making use of the available real estate in 3D multichip modules, and energy requirements of very large neural networks are discussed.
Journal ArticleDOI

Design impact of positive temperature dependence of drain current in sub 1 V CMOS VLSIs

TL;DR: In this article, the authors describe possible temperature instability in the low-voltage regime by using circuit simulation environments incorporating temperature change in time and experiments using MOSFET's and 32-bit adder circuit in quarter micron CMOS technology with low threshold voltage of 0.25 V.
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