scispace - formally typeset
Journal ArticleDOI

Optimizing Decoupling Capacitors in 3D Circuits for Power Grid Integrity

TLDR
The paper explores the trade-offs between MIM decaps and traditional CMOS decaps in chip design, and proposes a congestion-aware 3D power supply network optimization algorithm to optimize this trade-off.
Abstract
This article studies one of the EDA problems for 3D IC design. The article presents a design automation solution for power grid optimization in 3D ICs. The authors propose a congestion-aware 3D power supply network optimization algorithm, which applies a sequence-of-linear-programs-based method to optimize the power grid design. We explore the trade-offs between MIM decaps and traditional CMOS decaps in chip design, and we propose a congestion-aware 3D power supply network optimization algorithm to optimize this trade-off. One of the novel features of our work is that it optimizes the power supply network using both conventional CMOS decaps and metal insulator-metal (MIM) decaps. However, because MIM decaps are built between layers of metal interconnects, they present routing blockages to nets that attempt to cross them, and therein lies the trade-off. The properties of MIM decaps make them attractive for both 2D and 3D chips, but we pay particular attention to the 3D decap problem in this article because, first, the power integrity problem is particularly critical in 3D, and requires novel approaches that leverage advances in materials, and second, the added complexity of handling routing blockages in a constrained environment makes the 3D problem especially challenging.

read more

Citations
More filters
Journal ArticleDOI

TSV Redundancy: Architecture and Design Issues in 3-D IC

TL;DR: A redundant TSV architecture with reasonable cost is proposed in this paper and analysis on overall yield shows that the proposed design can successfully recover most of the failed chips and increase the yield of TSV to 99.4%.
Journal ArticleDOI

Security and Vulnerability Implications of 3D ICs

TL;DR: This paper reports current research work on 3D integration based security in three major applications: supply chain attack prevention, side-channel attack mitigation, and trustworthy computing system design and summarizes its security opportunities and challenges.
Journal ArticleDOI

Distributed TSV Topology for 3-D Power-Supply Networks

TL;DR: This work studies the design of 3-D power supply networks and demonstrates a technique specific to3-D systems that improves IR-drop and dynamic noise over a straightforward extension of traditional design techniques.
Journal ArticleDOI

Power Distribution in TSV-Based 3-D Processor-Memory Stacks

TL;DR: It is demonstrated that the area overhead of a 3-D power distribution network with via-first TSVs is approximately 9% as compared to less than 2% in via-middle and via-last technologies.
Journal ArticleDOI

PCB Decoupling Optimization With Variable Number of Capacitors

TL;DR: An approach based on the combination of time-domain contour integral method and optimization with variable number of dimensions is introduced and works with models having variable dimensions and searches for the optimal one.
References
More filters
Proceedings ArticleDOI

Power supply noise analysis methodology for deep-submicron VLSI chip design

TL;DR: A new design methodology to analyzethe on-chip power supply noise for high-performance microprocessors based on an integrated package-level and chip-level power bus model, and a simulated switching circuit model for each functional block offers the most complete and accurate analysis of Vdd distribution.
Journal ArticleDOI

Estimating routing congestion using probabilistic analysis

TL;DR: A net-based stochastic model for computing expected horizontal and vertical track usage, which considers routing blockages is proposed and the main advantages of this algorithm are its accuracy and fast runtime.
Proceedings ArticleDOI

Power Delivery for 3D Chip Stacks: Physical Modeling and Design Implication

TL;DR: In this article, an analytical physical model is derived to incorporate the impact of 3D-integration on power supply noise, such as inserting decap die and through-vias.
Proceedings ArticleDOI

Placement of 3D ICs with thermal and interlayer via considerations

TL;DR: Analytical and partitioning-based techniques are developed to explore the tradeoff between wirelength, interlayer via counts, and thermal effects, which allows wirelengths to be minimized for any desired inter layer via density and temperatures to be reduced while minimizing deleterious effects on wirelength and interlayervia counts.
Proceedings ArticleDOI

3D-STAF: scalable temperature and leakage aware floorplanning for three-dimensional integrated circuits

TL;DR: This work proposes and evaluates a scalable, temperature-aware, force-directed fioorplanner called 3D-STAF, which has good performance that scales well for large problem instances and improves the area, area, wire length, via count, and peak temperature while running nearly 4times faster on average.
Related Papers (5)