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Aarno Parssinen
Researcher at University of Oulu
Publications - 238
Citations - 4505
Aarno Parssinen is an academic researcher from University of Oulu. The author has contributed to research in topics: Amplifier & Antenna (radio). The author has an hindex of 32, co-authored 236 publications receiving 3962 citations. Previous affiliations of Aarno Parssinen include Broadcom & Aalto University.
Papers
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Proceedings ArticleDOI
Session 18 overview: Full duplex wireless front-ends
TL;DR: Three distinct approaches are presented covering communication and radar signals in the radio front-end to suppress the transmit signal and associated artifacts so that it does not saturate the receiver.
Proceedings ArticleDOI
Noise Consideration of Radio Receivers Using Silicon Technologies Towards 6G Communication
TL;DR: In this article, the authors present the behavior of noise parameter as a function of frequency in transistor level and in simulated low noise amplifiers using state-of-the-art CMOS SOI and SiGe BiCMOS technologies.
Patent
Apparatus and method
TL;DR: In this article, a first antenna is configured to receive an alignment signal from a first transmitter through a first communication channel, and a second antenna is used to exchange data with a second transmitter via a second communication channel.
Waveforms for sub-THz 6G: Design Guidelines
Nuutti Tervo,Aarno Parssinen,Le-Hang Nguyen,Hardy Halbauer,Kilian Roth,Vaidyanathan Vinoth Kumar,Tommy Svensson,Ahmad Nimr,Stephan Zeitz,Meik Dorpinghaus,Gerhard Fettweis +10 more
TL;DR: In this paper , general guidelines for the waveform design are given, together with a non-exhaustive list of exemplary waveforms that can be used to meet the design requirements.
Proceedings ArticleDOI
Depolarization Due to Wedge Diffraction in Satellite Radiowave Communication
TL;DR: In this paper, the depolarization effect due to the electromagnetic wave diffraction from the rooftop wedge of a building at 1.575 GHz frequency is presented, and the experimental result of RHCP signal was compared with a theoretical knife-edge diffraction model.