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Journal ArticleDOI

Anisotropic Etching of Crystalline Silicon in Alkaline Solutions I . Orientation Dependence and Behavior of Passivation Layers

Helmut Seidel, +3 more
- 01 Nov 1990 - 
- Vol. 137, Iss: 11, pp 3612-3626
TLDR
In this article, the anisotropic etching behavior of single-crystal silicon and the behavior of and in an ethylenediamine-based solution as well as in aqueous,, and were studied.
Abstract
The anisotropic etching behavior of single‐crystal silicon and the behavior of and in an ethylenediaminebased solution as well as in aqueous , , and were studied. The crystal planes bounding the etch front and their etch rates were determined as a function of temperature, crystal orientation, and etchant composition. A correlation was found between the etch rates and their activation energies, with slowly etching crystal surfaces exhibiting higher activation energies and vice versa. For highly concentrated solutions, a decrease of the etch rate with the fourth power of the water concentration was observed. Based on these results, an electrochemical model is proposed, describing the anisotropic etching behavior of silicon in all alkaline solutions. In an oxidation step, four hydroxide ions react with one surface silicon atom, leading to the injection of four electrons into the conduction band. These electrons stay localized near the crystal surface due to the presence of a space charge layer. The reaction is accompanied by the breaking of the backbonds, which requires the thermal excitation of the respective surface state electrons into the conduction band. This step is considered to be rate limiting. In a reduction step, the injected electrons react with water molecules to form new hydroxide ions and hydrogen. It is assumed that these hydroxide ions generated at the silicon surface are consumed in the oxidation reaction rather than those from the bulk electrolyte, since the latter are kept away from the crystal by the repellent force of the negative surface charge. According to this model, monosilicic acid is formed as the primary dissolution product in all anisotropic silicon etchants. The anisotropic behavior is due to small differences of the energy levels of the backbond surface states as a function of the crystal orientation.

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Citations
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Journal ArticleDOI

Etch rates for micromachining processing-Part II

TL;DR: In this paper, the etch rates of 53 materials that are used or potentially can be used or in the fabrication of microelectromechanical systems and integrated circuits were prepared.
Journal ArticleDOI

A Physically Transient Form of Silicon Electronics

TL;DR: A set of materials, manufacturing schemes, device components, and theoretical design tools for a silicon-based complementary metal oxide semiconductor (CMOS) technology that has this type of transient behavior are reported, together with integrated sensors, actuators, power supply systems, and wireless control strategies.
Journal ArticleDOI

Etch rates for micromachining processing

TL;DR: The etch rates for 317 combinations of 16 materials (single-crystal silicon, doped, and undoped polysilicon, several types of silicon dioxide, stoichiometric and silicon-rich silicon nitride, aluminum, tungsten, titanium, Ti/W alloy, and two brands of positive photoresist) used in the fabrication of microelectromechanical systems and integrated circuits in 28 wet, plasma, and plasmaless-gas-phase etches (several HF solutions, H/sub 3/PO/sub 4), HNO/sub
Journal ArticleDOI

Bulk micromachining of silicon

TL;DR: In this article, the available etching methods fall into three categories in terms of the state of the etchant: wet, vapor, and plasma, and they are reviewed and compared by comparing the results, cost, complexity, process compatibility, and other factors.
References
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Book

CRC Handbook of Chemistry and Physics

TL;DR: CRC handbook of chemistry and physics, CRC Handbook of Chemistry and Physics, CRC handbook as discussed by the authors, CRC Handbook for Chemistry and Physiology, CRC Handbook for Physics,

The Chemistry of Silica

Kr Iler
Book

Physics at Surfaces

TL;DR: Physics at Surfaces as discussed by the authors is a unique graduate-level introduction to the physics and chemical physics of solid surfaces and atoms and molecules that interact with solid surfaces, and it provides a synthesis of the entire field of surface physics from the perspective of a modern condensed matter physicist with a healthy interest in chemical physics.
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