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Proceedings ArticleDOI

Low power single bitline 6T SRAM cell with high read stability

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TLDR
This paper presents a novel CMOS 6-transistor SRAM cell for different purposes including low power embedded SRAM applications and stand-aloneSRAM applications that uses a single bit-line for both read and write purposes.
Abstract
This paper presents a novel CMOS 6-transistor SRAM cell for different purposes including low power embedded SRAM applications and stand-alone SRAM applications. The data is retained by the cell with the help of leakage current and positive feedback, and does not use any refresh cycle. The size of the new cell is comparable to the conventional six-transistor cell of same technology and design rules. Also, the proposed cells uses a single bit-line for both read and write purposes.

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Proceedings Article

A 0.6 V Dual-Rail Compiler SRAM Design on 45 nm CMOS Technology With Adaptive SRAM Power for Lower VDD_min VLSIs

TL;DR: A 0.6 V 45 nm dual-rail SRAM design utilizing an adaptive voltage regulator targeted for the SRAM compiler application is proposed for the first time, and the bit-line (BL) is precharged to VDD instead of CVDD.
Proceedings ArticleDOI

Design of low power stable SRAM cell

TL;DR: In this paper, a nine transistors SRAM cell was proposed to reduce the static power and total power dissipation in a 250-nm CMOS technology, where three extra transistors were added to the conventional six transistors cell.
Proceedings ArticleDOI

VLSI design of low power SRAM architectures for FPGAs

TL;DR: In this article, different architectures of low power SRAM cells are compared with respect to parameters such as data retention stability, area, power dissipation, feature size, and memory capacity.
Journal ArticleDOI

Advances on Low Power Designs for SRAM Cell

TL;DR: In this paper, the authors reviewed and discussed several methods to overcome the power dissipation problem of SRAM and gave some idea for future research to improve the design of low power SRAM cell.
References
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Book

Digital integrated circuits: a design perspective

Jan M. Rabaey
TL;DR: In this paper, the authors present a survey of the state-of-the-art in the field of digital integrated circuits, focusing on the following: 1. A Historical Perspective. 2. A CIRCUIT PERSPECTIVE.
Proceedings ArticleDOI

Parameter variations and impact on circuits and microarchitecture

TL;DR: Process, voltage and temperature variations; and their impact on circuit and microarchitecture; and possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are presented.
Journal ArticleDOI

Static-noise margin analysis of MOS SRAM cells

TL;DR: In this article, the stability of both resistor-load (R-load) and full-CMOS SRAM cells is investigated analytically as well as by simulation, and explicit analytic expressions for the static-noise margin (SNM) as a function of device parameters and supply voltage are derived.
Journal ArticleDOI

The impact of intrinsic device fluctuations on CMOS SRAM cell stability

TL;DR: In this paper, the reduction in CMOS SRAM cell static noise margin due to intrinsic threshold voltage fluctuations in uniformly doped minimum-geometry cell MOSFETs is investigated using compact physical and stochastic models.
Proceedings ArticleDOI

Stable SRAM cell design for the 32 nm node and beyond

TL;DR: This work demonstrates the smallest 6T and full 8T-SRAM cells to date and provides a much greater enhancement in stability by eliminating cell disturbs during a read access, thus facilitating continued technology scaling.
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