Journal ArticleDOI
Modeling, Design, and Verification for the Analog Front-End of a MEMS-Based Parallel Scanning-Probe Storage Device
Christoph Hagleitner,T. Bonaccio,Hugo E. Rothuizen,Jan Lienemann,Dorothea Wiesmann,Giovanni Cherubini,Jan G. Korvink,Evangelos Eleftheriou +7 more
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TLDR
An accurate cantilever model based on the combination of a thermal/electrical lumped-element model and a behavioral model of the electrostatic/mechanical part are introduced and are well suited for system-level simulation and verification/extraction in a design environment based on standard EDA tools.Abstract:
We present an integrated analog front-end (AFE) for the read-channel of a parallel scanning-probe storage device. The read/write element is based on an array of microfabricated silicon cantilevers equipped with heating elements to form nanometer-sized indentations in a polymer surface using integral atomic-force microscope (AFM) tips. An accurate cantilever model based on the combination of a thermal/electrical lumped-element model and a behavioral model of the electrostatic/mechanical part are introduced. The behavioral model of the electrostatic/mechanical part is automatically generated from a full finite-element model (FEM). The model is completely implemented in Verilog-A and was used to co-develop the integrated analog front-end circuitry together with the read/write cantilever. The cantilever model and the analog front-end were simulated together and the results were experimentally verified. The approach chosen is well suited for system-level simulation and verification/extraction in a design environment based on standard EDA tools.read more
Citations
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1/f Noise Sources
TL;DR: In this article, a survey of 1/f noise in homogeneous semiconductor samples is presented, where a distinction is made between mobility noise and number noise, and it is shown that there always is mobility noise with an /spl alpha/ value with a magnitude in the order of 10/sup -4/.
Journal ArticleDOI
Probe-based ultrahigh-density storage technology
Angeliki Pantazi,Abu Sebastian,Theodore Antonakopoulos,P. Bachtold,A. R. Bonaccio,J. Bonan,Giovanni Cherubini,Michel Despont,Richard Anthony DiPietro,Ute Drechsler,Urs Dürig,Bernd Gotsmann,Walter Häberle,Christoph Hagleitner,James L. Hedrick,D. Jubin,Armin W. Knoll,Mark A. Lantz,J. Pentarakis,Haralampos Pozidis,Russell C. Pratt,Hugo E. Rothuizen,R. Stutz,M. varsamou,Dorothea Wiesmann,Evangelos Eleftheriou +25 more
TL;DR: This is the first time a scanning-probe recording technology has reached this level of technical maturity, demonstrating the joint operation of all building blocks of a storage device.
Journal ArticleDOI
Advancements and challenges in development of atomic force microscopy for nanofabrication
TL;DR: In this paper, the authors discuss the major challenges in atomic force microscopy (AFM) nanofabrication, and the potential solutions to these challenges are discussed. And then, specific approaches for improving the repeatability by equipment automation and for enhancing its throughput or productivity by parallel processing and speed increasing are suggested.
Journal ArticleDOI
Modeling and Experimental Identification of Silicon Microheater Dynamics: A Systems Approach
Abu Sebastian,Dorothea Wiesmann +1 more
TL;DR: In this paper, a tractable feedback model for microheaters is presented, which separates the thermal and electrical response of the microheater into two operators, with a linear dynamic operator mapping the applied electrical power to the heater temperature and a nonlinear but memoryless operator mapping heater temperature to the electrical resistance.
Journal ArticleDOI
Three-dimensional patterning of nanostructures using atomic force microscopes
TL;DR: The recent advances of the fabrication technology using atomic force microscopes (AFMs) are reviewed with the focus on its effectiveness and flexibility in patterning three-dimensional (3D) engineering nanostructures as discussed by the authors.
References
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Journal ArticleDOI
1/f noise sources
TL;DR: In this paper, a survey of 1/f noise in homogeneous semiconductor samples is presented, where a distinction is made between mobility noise and number noise, and it is shown that there always is mobility noise with an /spl alpha/ value with a magnitude in the order of 10/sup -4/.
Journal ArticleDOI
The "millipede" - nanotechnology entering data storage
Peter Vettiger,Graham L. W. Cross,Michel Despont,Ute Drechsler,Urs Dürig,Bernd Gotsmann,Walter Häberle,Mark A. Lantz,Hugo E. Rothuizen,R. Stutz,Gerd Binnig +10 more
TL;DR: In this paper, a new scanning-probe-based data-storage concept called the "millipede" is presented, which combines ultrahigh density, terabit capacity, small form factor, and high data rate.
Journal ArticleDOI
A 4-MHz CMOS continuous-time filter with on-chip automatic tuning
Francois Krummenacher,N. Joehl +1 more
TL;DR: This paper presents a 3rd order low-pass continuous-time filter with 4 MHz cut-off frequency, integrated in a 3 μm CMOS process, based on the direct simulation of a doubly-terminated LC ladder using capacitors and fully-balanced, current-controlled transconductance amplifiers with extended linear range.
Proceedings Article
A 4-MHz CMOS Continuous-Time Filter with On-Chip Automatic Tuning
Francois Krummenacher,N. Joehl +1 more
TL;DR: In this article, a 3rd order low-pass continuous-time filter with 4 MHz cut-off frequency, integrated in a 3?m CMOS process, is presented, based on direct simulation of a doublyterminated LC ladder using capacitors and fully-balanced, current-controlled transconductance amplifiers with extended linear range.
Journal ArticleDOI
A trajectory piecewise-linear approach to model order reduction and fast simulation of nonlinear circuits and micromachined devices
Michal Rewienski,Jacob K. White +1 more
TL;DR: This paper presents an approach to the nonlinear model reduction based on representing the non linear system with a piecewise-linear system and then reducing each of the pieces with a Krylov projection, and shows that the macromodels obtained are significantly more accurate than models obtained with linear or the recently developed quadratic reduction techniques.