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Luca Sterpone

Researcher at Polytechnic University of Turin

Publications -  236
Citations -  3523

Luca Sterpone is an academic researcher from Polytechnic University of Turin. The author has contributed to research in topics: Fault injection & Field-programmable gate array. The author has an hindex of 24, co-authored 222 publications receiving 3125 citations. Previous affiliations of Luca Sterpone include Instituto Politécnico Nacional.

Papers
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Proceedings ArticleDOI

A new decompression system for the configuration process of SRAM-based FPGAS

TL;DR: A novel configuration compression system that exploits internal configuration mechanism of modern SRAM-based FPGAs and results in high compression efficiency and does not require any external hardware support and allows high speed dynamic reconfiguration.
Book ChapterDOI

Timing Driven Placement for Fault Tolerant Circuits Implemented on SRAM-Based FPGAs

TL;DR: A new timing-driven placement algorithm is proposed for implementing soft-errors resilient circuits on SRAM-based FPGAs with a negligible degradation of performance based on a placement heuristic able to remove the crossing error domains while decreasing the routing congestions and delay inserted by the TMR routing and voting scheme.
Proceedings ArticleDOI

An FPGA-based testing platform for the validation of automotive powertrain ECU

TL;DR: A new FPGA-based platform able to supervise and validate Commercial-Off-The-Shelf timer modules used in today state-of-the-art software applications for automotive fuel injection system with an accuracy improvement of more than 20% with respect to traditional approach is presented.
Proceedings ArticleDOI

An experimental analysis of hardening techniques for SRAM-based FPGAs

TL;DR: This work analyzed by means of extensive fault-injection experiments the TMR architecture and identified some of the causes that are responsible for the escaped faults, and proposed some possible solutions.
Journal ArticleDOI

A probe-based SEU detection method for SRAM-based FPGAs

TL;DR: A detection solution able to detect SEU-effects before they affect the circuit functionalities is proposed and has a negligible impact on the circuit timing and it has a limited cost in terms of area usage.