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Luca Sterpone

Researcher at Polytechnic University of Turin

Publications -  236
Citations -  3523

Luca Sterpone is an academic researcher from Polytechnic University of Turin. The author has contributed to research in topics: Fault injection & Field-programmable gate array. The author has an hindex of 24, co-authored 222 publications receiving 3125 citations. Previous affiliations of Luca Sterpone include Instituto Politécnico Nacional.

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Proceedings ArticleDOI

Experimental analysis of SEL sensitiveness on Atmel MG2RT technology

TL;DR: In this paper, a single event latchup (SEL) in gate arrays with MG2RT technology is examined with respect to the strike of heavy ions at GANIL radiation facility.
Proceedings ArticleDOI

Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features

TL;DR: In this article, the authors present a new methodology which uses machine learning clustering techniques to group flip-flops with similar expected contributions to the overall functional failure rate, based on the analysis of a compact set of features combining attributes from static elements and dynamic elements.
Proceedings ArticleDOI

Dependability evaluation of transient fault effects in reconfigurable compute fabric devices

TL;DR: An evaluation of the effects induced by transient faults within the resources of an RCF Motorola MRC6011 is reported and extensive fault injection is resorted to to investigate the effects of transient faults.
Posted Content

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems

TL;DR: The RESCUE project as mentioned in this paper is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies, and the objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers.
Proceedings ArticleDOI

Effective Characterization of Radiation-induced SET on Flash-based FPGAs

TL;DR: This paper proposes a new analysis to characterize the SET phenomena within Flash-based FPGAs and indicates that single Event Transients are one of the major concern for flash-based Field Programmable Gate Arrays.