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Muhammad Mustafa Hussain

Researcher at King Abdullah University of Science and Technology

Publications -  333
Citations -  6943

Muhammad Mustafa Hussain is an academic researcher from King Abdullah University of Science and Technology. The author has contributed to research in topics: Silicon & Metal gate. The author has an hindex of 39, co-authored 330 publications receiving 5355 citations. Previous affiliations of Muhammad Mustafa Hussain include University of California, Berkeley & SEMATECH.

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Proceedings ArticleDOI

Corrugation Enabled Ultraflexible Monocrystalline Silicon Solar Cells with Interdigitated Back Contacts

TL;DR: In this article, the authors developed ultraflexible monocrystalline silicon solar cells using a corrugation technique, which consists of producing alternating trenches following different patterns, allowing for different characteristics of the solar cell with regard to flexing capability output power and weight.
Journal ArticleDOI

A thermal microfluidic actuator based on a novel microheater

TL;DR: In this article , a microfluidic actuator was integrated into a microheater and poly-dimethylsiloxane-expancel, controlling the operation/actuation of a fluid through a microchannel.
Proceedings ArticleDOI

Direct measurement of graphene contact resistivity to pre-deposited metal in buried contact test structure

TL;DR: In this article, the authors demonstrate a buried contact based novel test structure for direct contact resistivity measurement of graphene-metal interfaces and observe excellent contact resistivities ~1 μO-cm2 without any additional surface modification.
Proceedings ArticleDOI

La-doped metal/high-K nMOSFET for sub-32nm HP and LSTP application

TL;DR: In this paper, the La-doped high-k/metal gate stack was investigated for sub-32nm LSTP and HP applications and the results indicated that employing the metal electrode suppresses V t variability while no additional parameter fluctuations were observed.
Proceedings ArticleDOI

Gate First Band Edge High-k/Metal Stacks with EOT=0.74nm for 22nm Node nFETs

TL;DR: For the first time a gate first high-k/metal gate (MG) nFET with EOT = 0.74 nm is demonstrated with low leakage, low leakage (> 200x reduction vs. SiO2/PolySi) and good PBTI.