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Institution

Delft University of Technology

EducationDelft, Zuid-Holland, Netherlands
About: Delft University of Technology is a education organization based out in Delft, Zuid-Holland, Netherlands. It is known for research contribution in the topics: Computer science & Catalysis. The organization has 37681 authors who have published 94404 publications receiving 2741710 citations. The organization is also known as: TU-Delft & Technische Hogeschool Delft.


Papers
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Journal ArticleDOI
TL;DR: In this paper, a spray pyrolysis recipe was proposed to improve the external quantum efficiency of spray-deposited BiVO4 photoanodes by a factor of ∼7, leading to an unprecedented IPCE of 46%.
Abstract: BiVO4 has received much recent interest as a promising photocatalyst for oxygen evolution from water, but little is known about the factors that limit its performance as a photoanode. In this article, we report on highly efficient and reproducible BiVO4 photoanodes prepared by a new spray pyrolysis recipe. For undoped films deposited on a transparent conducting substrate (F-doped SnO2, FTO), electron transport and charge collection at the back-contact were found to limit the photoresponse. Electron transport could be greatly enhanced by donor-doping with 1% W, while the charge collection problem has been solved by introducing a thin (∼10 nm) interfacial layer of SnO2 in between the FTO and the BiVO4. This layer presumably acts as a hole mirror that prevents recombination via FTO-related defect states at the FTO/BiVO4 interface. By addressing these two issues, the external quantum efficiency (IPCE) of spray-deposited BiVO4 films was improved by a factor of ∼7, leading to an unprecedented IPCE of 46% (at 45...

368 citations

Journal ArticleDOI
TL;DR: In this article, the authors present a critical assessment of the state-of-the-art of the wide and complex field of modelling and simulation of metal cutting operations based on information obtained from the members of the working group, from consultation in industry, study of relevant literature and discussions at meetings of the Working Group whit the aim to stimulate and pilot future developments.

368 citations

Journal ArticleDOI
TL;DR: In this article, the authors considered the problem of finding the root of λ which gives the most serious state of stress in the vertex region (the region r → 0) is the root closest to the limiting value Re λ > −3/2.

368 citations

Journal ArticleDOI
TL;DR: In this article, a review of the generation of shear forces by pneumatic tyres under steady state conditions is presented, in a practical context, through reference to the uses to which models may be put by the vehicle dynamicist and the tyre designer.
Abstract: SUMMARY Modelling of the generation of shear forces by pneumatic tyres under steady state conditions is reviewed. The review is placed in a practical context, through reference to the uses to which models may be put by the vehicle dynamicist and the tyre designer. It will be of interest also to the student of rolling contact problems. The subject is divided into sections, covering physically founded models which require computation for their solution, physically based models which are sufficiently simplified to allow analytical solutions and formula based, empirical models. The classes are more nearly continuous than this strict division would imply, since approximations in obtaining analytical solutions may be made, empirical correction factors may be applied to analytical results and formula based methods may take into account tyre mechanical principles. Such matters are discussed in the relevant sections. Attention is given to the important matter of choosing model parameters to best represent the beha...

367 citations

Journal ArticleDOI
05 Dec 2005
TL;DR: In this paper, a low-cost temperature sensor with on-chip sigma-delta ADC and digital bus interface was realized in a 0.5 /spl mu/m CMOS process.
Abstract: A low-cost temperature sensor with on-chip sigma-delta ADC and digital bus interface was realized in a 0.5 /spl mu/m CMOS process. Substrate PNP transistors are used for temperature sensing and for generating the ADC's reference voltage. To obtain a high initial accuracy in the readout circuitry, chopper amplifiers and dynamic element matching are used. High linearity is obtained by using second-order curvature correction. With these measures, the sensor's temperature error is dominated by spread on the base-emitter voltage of the PNP transistors. This is trimmed after packaging by comparing the sensor's output with the die temperature measured using an extra on-chip calibration transistor. Compared to traditional calibration techniques, this procedure is much faster and therefore reduces production costs. The sensor is accurate to within /spl plusmn/0.5/spl deg/C (3/spl sigma/) from -50/spl deg/C to 120/spl deg/C.

366 citations


Authors

Showing all 38152 results

NameH-indexPapersCitations
Albert Hofman2672530321405
Charles M. Lieber165521132811
Ad Bax13848697112
George C. Schatz137115594910
Georgios B. Giannakis137132173517
Jaap S. Sinninghe Damsté13472661947
Avelino Corma134104989095
Mark A. Ratner12796868132
Jing Kong12655372354
Robert J. Cava125104271819
Reza Malekzadeh118900139272
Jinde Cao117143057881
Mike S. M. Jetten11748852356
Liquan Chen11168944229
Oscar H. Franco11182266649
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20241
2023393
2022784
20215,396
20205,525
20195,230