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Homoepitaxial growth of β-Ga2O3 layers by metal-organic vapor phase epitaxy

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TLDR
In this paper, the structural properties of the β-Ga2O3 epitaxial layers were characterized by X-ray diffraction pattern and high resolution transmission electron microscopy.
Abstract
Epitaxial β-Ga2O3 layers have been grown on β-Ga2O3 (100) substrates using metal-organic vapor phase epitaxy. Trimethylgallium and pure oxygen or water were used as precursors for gallium and oxygen, respectively. By using pure oxygen as oxidant, we obtained nano-crystals in form of wires or agglomerates although the growth parameters were varied in wide range. With water as an oxidant, smooth homoepitaxial β-Ga2O3 layers were obtained under suitable conditions. Based on thermodynamical considerations of the gas phase and published ab initio data on the catalytic action of the (100) surface of β-Ga2O3 we discuss the adsorption and incorporation processes that promote epitaxial layer growth. The structural properties of the β-Ga2O3 epitaxial layers were characterized by X-ray diffraction pattern and high resolution transmission electron microscopy. As-grown layers exhibited sharp peaks that were assigned to the monocline gallium oxide phase and odd reflections that could be assigned to stacking faults and twin boundaries, also confirmed by TEM. Shifts of the layer peak towards smaller 2θ values with respect to the Bragg reflection for the bulk peaks have been observed. After post growth thermal treatment in oxygen-containing atmosphere the reflections of the layers do shift back to the position of the bulk β-Ga2O3 peaks, which was attributed to significant reduction of lattice defects in the grown layers after thermal treatment.

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Journal ArticleDOI

A review of Ga2O3 materials, processing, and devices

TL;DR: The role of defects and impurities on the transport and optical properties of bulk, epitaxial, and nanostructures material, the difficulty in p-type doping, and the development of processing techniques like etching, contact formation, dielectrics for gate formation, and passivation are discussed in this article.
Journal ArticleDOI

Perspective: Ga2O3 for ultra-high power rectifiers and MOSFETS

TL;DR: In this article, the performance of high voltage rectifiers and enhancement-mode metal-oxide field effect transistors on Ga2O3 has been evaluated and shown to benefit from the larger critical electric field relative to either SiC or GaN.
Journal ArticleDOI

Homoepitaxial growth of β-Ga2O3 layers by halide vapor phase epitaxy

TL;DR: In this article, high-purity β-Ga2O3 layers of high crystalline quality were grown homoepitaxially by halide vapor phase epitaxy (HVPE) using gaseous GaCl and O2 on (001) and (002) substrates prepared by edge defined film-fed growth.
References
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Journal ArticleDOI

Transparent Conducting Oxides for Photovoltaics

TL;DR: Transparent conducting oxides (TCO) are an increasingly important component of photovoltaic (PV) devices, where they act as electrode elements, structural templates, and diffusion barriers, and their work function controls the open-circuit device voltage.
Journal ArticleDOI

Deep-ultraviolet transparent conductive β-Ga2O3 thin films

TL;DR: In this article, β-Ga2O3 with an energy band gap of 4.9 eV was prepared on silica glass substrates by a pulsed-laser deposition method, and the resulting internal transmittance at the wavelength (248 nm) of the KrF excimer laser exceeded 50% for the 100-nm-thick film.
Journal ArticleDOI

Ga2O3 thin film growth on c-plane sapphire substrates by molecular beam epitaxy for deep-ultraviolet photodetectors

TL;DR: In this paper, a β-Ga2O3 thin film was grown on c-plane sapphire substrates by plasma-assisted molecular beam epitaxy, which exhibited a sharp absorption edge at around 5.0 eV, which is in the deep-ultraviolet region.
Journal ArticleDOI

III-Nitride UV Devices

TL;DR: The need for efficient, compact and robust solid-state UV optical sources and sensors had stimulated the development of optical devices based on III-nitride material system as mentioned in this paper, which enabled rapid progress in material growth, device fabrication and packaging enabled demonstration of high efficiency visible-blind and solar-blind photodetectors, deep-UV light-emitting diodes with emission from 400 to 250 nm.
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