: This research organizes, presents, and analyzes contemporary Multiobjective Evolutionary Algorithm (MOEA) research and associated Multiobjective Optimization Problems (MOPs). Using a consistent MOEA terminology and notation, each cited MOEAs' key factors are presented in tabular form for ease of MOEA identification and selection. A detailed quantitative and qualitative MOEA analysis is presented, providing a basis for conclusions about various MOEA-related issues. The traditional notion of building blocks is extended to the MOP domain in an effort to develop more effective and efficient MOEAs. Additionally, the MOEA community's limited test suites contain various functions whose origins and rationale for use are often unknown. Thus, using general test suite guidelines appropriate MOEA test function suites are substantiated and generated. An experimental methodology incorporating a solution database and appropriate metrics is offered as a proposed evaluation framework allowing absolute comparisons of specific MOEA approaches. Taken together, this document's classifications, analyses, and new innovations present a complete, contemporary view of current MOEA "state of the art" and possible future research. Researchers with basic EA knowledge may also use part of it as a largely self-contained introduction to MOEAs.

Multiobjective evolutionary algorithms: classifications, analyses, and new innovations

From the Publisher:
This work covers all aspects of physical design. The book is a core reference for graduate students and CAD professionals. For students, concept and algorithms are presented in an intuitive manner. For CAD professionals, the material presents a balance of theory and practice. An extensive bibliography is provided which is useful for finding advanced material on a topic. At the end of each chapter, exercises are provided, which range in complexity from simple to research level.

Algorithms for VLSI Physical Design Automation

This paper is the result of a literature study carried out by the authors. It is a review of the different attempts made to solve the Travelling Salesman Problem with Genetic Algorithms. We present crossover and mutation operators, developed to tackle the Travelling Salesman Problem with Genetic Algorithms with different representations such as: binary representation, path representation, adjacency representation, ordinal representation and matrix representation. Likewise, we show the experimental results obtained with different standard examples using combination of crossover and mutation operators in relation with path representation.

/pdf/genetic-algorithms-for-the-travelling-salesman-problem-a-32dhoaos11.pdf

Genetic Algorithms for the Travelling Salesman Problem: A Review of Representations and Operators

Hybrid metaheuristics have received considerable interest these recent years in the field of combinatorial optimization. A wide variety of hybrid approaches have been proposed in the literature. In this paper, a taxonomy of hybrid metaheuristics is presented in an attempt to provide a common terminology and classification mechanisms. The taxonomy, while presented in terms of metaheuristics, is also applicable to most types of heuristics and exact optimization algorithms.

As an illustration of the usefulness of the taxonomy an annoted bibliography is given which classifies a large number of hybrid approaches according to the taxonomy.

A Taxonomy of Hybrid Metaheuristics

We consider a fully SAT-based method of unbounded symbolic model checking based on computing Craig interpolants. In benchmark studies using a set of large industrial circuit verification instances, this method is greatly more efficient than BDD-based symbolic model checking, and compares favorably to some recent SAT-based model checking methods on positive instances.

Interpolation and SAT-based model checking

Modern VLSI design methodologies and manufacturing technologies are making circuits increasingly fast. The quest for higher circuit performance and integration density stems from fields such as the telecommunication one where high speed and capability of dealing with large data sets is mandatory. The design of high-speed circuits is a challenging task, and can be carried out only if designers can exploit suitable CAD tools. Among the several aspects of high-speed circuit design, controlling power consumption is today a major issue for ensuring that circuits can operate at full speed without damages. In particular, tools for fast and accurate estimation of power consumption of high-speed circuits are required. In this paper we focus on the problem of predicting the maximum power consumption of sequential circuits. We formulate the problem as a constrained optimization problem, and solve it resorting to an evolutionary algorithm. Moreover, we empirically assess the effectiveness of our problem formulation with respect to the classical unconstrained formulation. Finally, we report experimental results assessing the effectiveness of the prototypical tool we implemented.

Prediction of Power Requirements for High-Speed Circuits

Burn-In test equipment usually owns extensive memory capabilities to store pre-computed patterns to be applied to the circuit inputs as well as ad-hoc circuitries to drive and read the DUT pins during the BI phase. The solution proposed in this paper dramatically reduces the memory size requirement and just demands a generic microcontroller unit (MCU) equipped with a couple of embedded processors, some standard common peripheral units, and a few KB memories. Moreover, the proposed Burn-In tester could be integrated into a System Level Test equipment which is typically based on MCUs to communicate functionally with the DUT. This paper provides full details about the architecture of such a low-cost innovative tester, which can supply the DUT with unlimited pseudo-random patterns created autonomously by the MCU firmware from any selected seed. The tester prototype developed to collect experimental results includes a low-cost System-on-Chip based on a multi-core MCU and a set of peripheral cores, encompassing timers and Direct Memory Access modules. The tester prototype is used to stress an automotive chip accounting for about 20 million gates, 700 thousand scan flip-flops, and several scan modes. The combination of pseudo-random pattern generation with the ability to control different scan and Design for Testability (DfT) modes, including LBIST, permits to reach a higher coverage of stress metrics than by the application of a limited set of pre-computed ATPG patterns. The toggle coverage level reached is up to 95.89%. The application speed achieved by the tester with non-optimized connections is up to about 10MHz.

https://ieeexplore.ieee.org/ielx7/12/4358213/09861726.pdf

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress

Traditional test generation methodologies for peripheral cores resort heavily to low-level descriptions of the circuit, leading to long generation times. Methodologies based on high-level descriptions can only be used if a clear relationship exists between the measured high-level coverage and the gate-level fault coverage. Even in medium complexity circuits, however, a direct relationship between code coverage metrics and fault coverage is not guaranteed, while other RT level metrics require an effort comparable to the use of low level descriptions. To overcome this problem, in the case of peripheral cores, a new approach is proposed: FSMs embedded in the system are identified and dynamically extracted via simulation, while transition coverage is used as a measure of how much the system is exercised. Model extraction and coverage maximization are performed concurrently in a completely automated way. This new technique is exploited to drive an unsupervised methodology for generating tests for peripheral cores. Experimental analysis shows the effectiveness of the approach.

On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction

Graphics Processing Units (GPUs) are over-stressed to accelerate High-Performance Computing applications and are used to accelerate Deep Neural Networks in several domains where they have a life expectancy of many years. These conditions expose the GPUs hardware to (premature) aging, causing permanent faults to arise after the usual end-of-manufacturing test. Techniques to assess the impact of permanent faults in GPUs are then strongly required, thus allowing to estimate the reliability risk and to possibly mitigate it. In this paper, we present a method to evaluate the effects of permanent faults affecting the GPU scheduler and control units, which are the most peculiar and stressed resources, along with the first figures that allow quantifying these effects. We characterize over 5.83x10^5 permanent fault effects in the scheduler and controllers of a gate-level GPU model. Then, we map the observed error categories in software by instrumenting the code of 13 applications and two convolutional neural networks, injecting more than 1.65x10^5 permanent errors. Our two-level fault injection strategy reduces the evaluation time from hundreds of years of gate-level evaluation to hundreds of hours.We found that faults in the GPU parallelism management units can modify the opcode, the addresses, and the status of thread(s) and warp(s). The large majority (up to 99%) of these hardware permanent errors impacts the running software execution. Errors affecting the instruction operation or resource management hang the code, while 45% of errors in the parallelism management or control-flow induce silent data corruptions.

Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units

New semiconductor technologies for advanced applications are more prone to defects and imperfections related, among several different causes, to the manufacturing process, aging and cross-talks. These phenomena negatively affect the circuit’s timing and can be effectively modeled by means of the path delay fault (PDF) model. While path delay testing is currently supported by commercial Automatic Test Pattern Generation tools for scan designs, functional testing covering PDFs is not widely adopted, mainly because of the high cost for test generation. On the other side, functional test is already widely adopted for in-field test of stuck-at faults, which is often performed resorting to the execution of suitable test programs (Self Test Libraries, or STLs). This approach is attractive, since it can be performed at-speed with limited time constraints and high flexibility, making it a suitable in-field test solutions. Previous work assessed the feasibility and validity of functional approaches based on test programs targeting PDFs. In this work, we present the first systematic method for the development of very high fault coverage test programs for PDFs, which largely outperform test programs written for other fault models. Moreover, the proposed method allows the identification of functionally untestable faults. The effectiveness of the proposed approach was proven on an open-source RISC-V processor core, where 100% coverage of the functionally testable longest paths was achieved, compared with an initial coverage of 0.52% achieved with test programs targeting stuck-at faults. Results demonstrate that shorter paths are also effectively covered. 

Matteo Sonza Reorda

Papers

Prediction of Power Requirements for High-Speed Circuits

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress

On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction

Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units

Self-Test Library Generation for In-field Test of Path Delay faults