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Theoretical aspects of atomic mixing by ion beams

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TLDR
In this paper, the half-widths of matrix relocation profiles were determined explicitly for ion-impurity knockon events (recoil implantation) as well as isotropic cascade mixing.
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This article is published in Nuclear Instruments and Methods.The article was published on 1981-04-15. It has received 443 citations till now. The article focuses on the topics: Mixing (physics).

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Shaping and compositional modification of zinc oxide nanowires under energetic manganese ion irradiation

TL;DR: The sputter-induced thinning of the wire is in good quantitative agreement with the experimental results obtained from pre- and post-irradiation scanning electron microscopy and the predicted sharpening of the tip, neck formation at the bottom interface, and the detachment of the nanowires from the substrate at high ion fluence.
Journal ArticleDOI

Progress in Ion Beam Mixing

TL;DR: In this paper, the experimental results of ion beam mixing of thin evaporated Sn layers in mixed Ge/Si solid solutions are reported, and tentative conclusions are drawn as to the likely directions for fruitful avenues of investigation.
Dissertation

Mise en oeuvre d'une approche multi-échelles fondée sur le champ de phase pour caractériser la microstructure des matériaux irradiés : application à l'alliage AgCu

TL;DR: In this article, the authors adopt le formalisme du melange ionique, introduced by Gras-Marti, for decrire le melange balistique au sein d'une cascade de deplacements.
Journal ArticleDOI

Ion-beam mixing of Ni/Pd layers: I. Cascade mixing regime (low temperature)

TL;DR: In this paper, the effects of heavy ion mixing resulting from heavy-ion bombardment of thin-film Ni/Pd bilayers and thin Pd markers sandwiched between Ni layers has been investigated.
Journal ArticleDOI

Ion beam mixing of titanium films on stainless steel

TL;DR: In this paper, the ion mixing of Ti-steel bilayers with N +, Ar +, Ti +, Kr + and Xe + ions was investigated by means of Rutherford backscattering spectroscopy (RBS).
References
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Journal ArticleDOI

Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets

TL;DR: In this article, an integrodifferential equation for the sputtering yield is developed from the general Boltzmann transport equation, and solutions of the integral equation are given that are asymptotically exact in the limit of high ion energy as compared to atomic binding energies.
Journal ArticleDOI

The depth resolution of sputter profiling

TL;DR: In this article, it is shown that the bulk radiation damage accompanying sputtering events sets ultimate limits to the depth resolution attainable in sputter profiling, and guidelines for selection of projectile species and energies to minimize such mixing are given and numerical estimates for attainable depth resolutions.
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