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Journal ArticleDOI

Thickness dependence of structural, electrical and optical properties of sprayed ZnO:Cu films

Mustafa Öztaş, +1 more
- 29 Feb 2008 - 
- Vol. 516, Iss: 8, pp 1703-1709
TLDR
In this article, the structural properties of spray-deposition ZnO:Cu thin films have been investigated by X-ray diffraction techniques and the results showed that polycrystalline structures are polycrystaline with hexagonal structure and show a good c-axis orientation perpendicular to the substrate.
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This article is published in Thin Solid Films.The article was published on 2008-02-29. It has received 174 citations till now. The article focuses on the topics: Thin film & Substrate (electronics).

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Citations
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Journal ArticleDOI

Comparative studies of Al-doped ZnO and Ga-doped ZnO transparent conducting oxide thin films

TL;DR: The structural and microstructural properties as a function of Al and Ga concentrations through X-ray diffraction and scanning electron microscopy analysis and the optical bandgap and photoluminescence were estimated.
Journal ArticleDOI

Preparation and photocatalytic activity of Cu-doped ZnO thin films prepared by the sol–gel method

TL;DR: In this article, two oxidation states of Cu in +1 and +2 were identified in the ZnO thin film by X-ray photoelectron spectroscopy (XPS) and their photocatalytic activities were investigated by the degradation of methylene blue dye under blacklight fluorescent tubes.
Journal ArticleDOI

Chemical bath deposited ZnO thin film based UV photoconductive detector

TL;DR: In this article, the effect of deposition time and thickness on the photoconductive properties of ZnO thin films is investigated and the physicochemical properties of these thin films are carried out.
Journal ArticleDOI

Room temperature ferromagnetism and gas sensing in ZnO nanostructures: Influence of intrinsic defects and Mn, Co, Cu doping

TL;DR: In this paper, a combination of defect structure analysis based on photoluminescence (PL) and electron paramagnetic resonance (EPR) was employed to detect coexisting oxygen vacancies (V O ) and zinc interstitials (Zn i ) defects in undoped and transition metal doped ZnO systems.
References
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Book

Elements of X-ray diffraction

TL;DR: In this article, the authors present a chemical analysis of X-ray diffraction by Xray Spectrometry and phase-diagram Determination of single crystal structures and phase diagrams.
Journal ArticleDOI

Elements of X‐Ray Diffraction

B. D. Cullity, +1 more
- 01 Mar 1957 - 
Journal ArticleDOI

Transparent conductors—A status review

TL;DR: In this paper, the authors present a comprehensive and up-to-date description of the deposition techniques, electro-optical properties, solid state physics of the electron transport and optical effects and some applications of these transparent conductors.
Journal ArticleDOI

Wide-bandgap high-mobility ZnO thin-film transistors produced at room temperature

TL;DR: In this paper, the authors reported high performance ZnO thin-film transistor (ZnO-TFT) fabricated by rf magnetron sputtering at room temperature with a bottom gate configuration.
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