다중혈관 관상동맥 환자에서 y-문합을 이용하여 양쪽 내흉동맥만을 사용한 우회술의 조기 성적

We present a comprehensive, up-to-date compilation of band parameters for the technologically important III–V zinc blende and wurtzite compound semiconductors: GaAs, GaSb, GaP, GaN, AlAs, AlSb, AlP, AlN, InAs, InSb, InP, and InN, along with their ternary and quaternary alloys. Based on a review of the existing literature, complete and consistent parameter sets are given for all materials. Emphasizing the quantities required for band structure calculations, we tabulate the direct and indirect energy gaps, spin-orbit, and crystal-field splittings, alloy bowing parameters, effective masses for electrons, heavy, light, and split-off holes, Luttinger parameters, interband momentum matrix elements, and deformation potentials, including temperature and alloy-composition dependences where available. Heterostructure band offsets are also given, on an absolute scale that allows any material to be aligned relative to any other.

Band parameters for III–V compound semiconductors and their alloys

We present a comprehensive and up-to-date compilation of band parameters for all of the nitrogen-containing III–V semiconductors that have been investigated to date. The two main classes are: (1) “conventional” nitrides (wurtzite and zinc-blende GaN, InN, and AlN, along with their alloys) and (2) “dilute” nitrides (zinc-blende ternaries and quaternaries in which a relatively small fraction of N is added to a host III–V material, e.g., GaAsN and GaInAsN). As in our more general review of III–V semiconductor band parameters [I. Vurgaftman et al., J. Appl. Phys. 89, 5815 (2001)], complete and consistent parameter sets are recommended on the basis of a thorough and critical review of the existing literature. We tabulate the direct and indirect energy gaps, spin-orbit and crystal-field splittings, alloy bowing parameters, electron and hole effective masses, deformation potentials, elastic constants, piezoelectric and spontaneous polarization coefficients, as well as heterostructure band offsets. Temperature an...

Band parameters for nitrogen-containing semiconductors

In the past several years, research in each of the wide‐band‐gap semiconductors, SiC, GaN, and ZnSe, has led to major advances which now make them viable for device applications. The merits of each contender for high‐temperature electronics and short‐wavelength optical applications are compared. The outstanding thermal and chemical stability of SiC and GaN should enable them to operate at high temperatures and in hostile environments, and also make them attractive for high‐power operation. The present advanced stage of development of SiC substrates and metal‐oxide‐semiconductor technology makes SiC the leading contender for high‐temperature and high‐power applications if ohmic contacts and interface‐state densities can be further improved. GaN, despite fundamentally superior electronic properties and better ohmic contact resistances, must overcome the lack of an ideal substrate material and a relatively advanced SiC infrastructure in order to compete in electronics applications. Prototype transistors have been fabricated from both SiC and GaN, and the microwave characteristics and high‐temperature performance of SiC transistors have been studied. For optical emitters and detectors, ZnSe, SiC, and GaN all have demonstrated operation in the green, blue, or ultraviolet (UV) spectra. Blue SiC light‐emitting diodes (LEDs) have been on the market for several years, joined recently by UV and blue GaN‐based LEDs. These products should find wide use in full color display and other technologies. Promising prototype UV photodetectors have been fabricated from both SiC and GaN. In laser development, ZnSe leads the way with more sophisticated designs having further improved performance being rapidly demonstrated. If the low damage threshold of ZnSe continues to limit practical laser applications, GaN appears poised to become the semiconductor of choice for short‐wavelength lasers in optical memory and other applications. For further development of these materials to be realized, doping densities (especially p type) and ohmic contact technologies have to be improved. Economies of scale need to be realized through the development of larger SiC substrates. Improved substrate materials, ideally GaN itself, need to be aggressively pursued to further develop the GaN‐based material system and enable the fabrication of lasers. ZnSe material quality is already outstanding and now researchers must focus their attention on addressing the short lifetimes of ZnSe‐based lasers to determine whether the material is sufficiently durable for practical laser applications. The problems related to these three wide‐band‐gap semiconductor systems have moved away from materials science toward the device arena, where their technological development can rapidly be brought to maturity.

Large‐band‐gap SiC, III‐V nitride, and II‐VI ZnSe‐based semiconductor device technologies

Industries such as the automotive, aerospace or military, as well as environmental and biological research have promoted the development of ultraviolet (UV) photodetectors capable of operating at high temperatures and in hostile environments. UV-enhanced Si photodiodes are hence giving way to a new generation of UV detectors fabricated from wide-bandgap semiconductors, such as SiC, diamond, III-nitrides, ZnS, ZnO, or ZnSe. This paper provides a general review of latest progresses in wide-bandgap semiconductor photodetectors.

https://iopscience.iop.org/article/10.1088/0268-1242/18/4/201/pdf

Wide-bandgap semiconductor ultraviolet photodetectors

The number of N atoms in N-rich regions mostly due to nonrandom N incorporation in GaAsN (N∼4%), referred to as the Nr rate, is studied using a nonstandard Raman setup that addresses transverse symmetry. The Ga–N optical range shows a two-mode signal which discriminates between the N-poor (Np) and N-rich (Nr) regions. This is discussed via a percolation-based picture for Be-chalcogenide alloys, which exhibit mechanical contrast with regard to the shear modulus. This applies to GaAs–GaN even though the contrast is in the bulk modulus. The balance of Nr/Np strength provides a Nr rate of ∼30%, i.e., much larger than the corresponding Be rate of ∼4% in random Be-based alloys.

Percolation-based vibrational picture to estimate nonrandom N substitution in GaAsN alloys

Liquid phase epitaxy and characterization of InAs1- x - ySb x P y on (100) InAs

Defect density in ZnSe pseudomorphic layers grown by molecular beam epitaxy on to various GaAs buffer layers

We give a bird's-eye view of the interface formation during MBE growth of various quasi lattice-matched as well as highly-mismatched semiconductor heterostructures We show that the parameters controlling the growth mode and the interface formation are numerous and that the optimum interface configuration depends on the materials system and on the target application Our results obtained from various semiconductor materials systems demonstrate that this growth and interface-related problem is much more complex than it has often been considered for many years (© 2007 WILEY-VCH Verlag GmbH & Co KGaA, Weinheim)

MBE growth and interface formation of compound semiconductor heterostructures for optoelectronics

An antimonide-based InAs/GaSb/InSb short-period superlattice (SPSL) laser diode on GaSb substrate for mid-infrared emission has been modeled by an accurate eight-band k.p model. By using a realistic graded and asymmetric interface profile, calculated energy gap between the electron and heavy-hole miniband shows good agreement with our experimental data. Optical gain and threshold current density are then presented and compared with experimental results of SPSL laser diodes operating in pulsed regime. Analysis of the optical performances obtained at room temperature is made.

Eric Tournié

Papers

Percolation-based vibrational picture to estimate nonrandom N substitution in GaAsN alloys

Liquid phase epitaxy and characterization of InAs1- x - ySb x P y on (100) InAs

Defect density in ZnSe pseudomorphic layers grown by molecular beam epitaxy on to various GaAs buffer layers

MBE growth and interface formation of compound semiconductor heterostructures for optoelectronics

Optical performances of InAs/GaSb/InSb short-period superlattice laser diode for mid-infrared emission