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Marc Meuris

Researcher at University of Hasselt

Publications -  335
Citations -  7963

Marc Meuris is an academic researcher from University of Hasselt. The author has contributed to research in topics: Passivation & Germanium. The author has an hindex of 47, co-authored 331 publications receiving 7570 citations. Previous affiliations of Marc Meuris include Katholieke Universiteit Leuven & IMEC.

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On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates

TL;DR: In this paper, the authors show that blindly applying these techniques on alternative substrates can lead to incorrect conclusions, and that it is possible to both under- and overestimate the interface trap density by more than an order of magnitude.
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Effective electrical passivation of Ge(100) for high-k gate dielectric layers using germanium oxide

TL;DR: In this paper, high-k dielectric layers on GeO2, grown at 350-450°C in O2, were deposited by atomic layer deposition (ALD), and ZrO2 and HfO2 intermix during ALD, together with partial reduction of Ge4+.
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Diffusion, activation and recrystallization of boron implanted in preamorphized and crystalline germanium

TL;DR: In this paper, the authors investigated diffusion and activation of boron implanted with 6 keV energy to a maximum concentration of 8.0×1020atoms∕cm3 in crystalline germanium (c-germanium) and preamorphized germium, employing rapid thermal annealing in the range of 400-600°C.