Finisar

About: Finisar is a company organization based out in Sunnyvale, California, United States. It is known for research contribution in the topics: Signal & Laser. The organization has 900 authors who have published 1523 publications receiving 22634 citations.

Methods for assembling an optical transceiver

Abstract: Methods for assembly of optical transceivers In one example, the method is performed in connection with an optical transceiver that includes a transmitter optical subassembly and a receiver optical subassembly, as well as structure that defines a pair of ports with which the transmitter optical subassembly and receiver optical subassembly, respectively, are to be aligned This example of the method involves positioning the transmitter optical subassembly and the receiver optical subassembly in a desired position relative to each other The transmitter optical subassembly and the receiver optical subassembly are then fixed in the desired position Next, the transmitter optical subassembly is aligned with one of the ports, and the receiver optical subassembly is aligned with the other port The alignment of both the transmitter optical subassembly and the receiver optical subassembly with their respective ports is performed in a single operation

Resonant reflector for increased wavelength and polarization control

Abstract: An optical system that includes at least two optical emitters and/or optical receivers that have a corresponding guided-mode grating resonant reflector filter (GMGRF). Each GMGRF is preferably tuned to a unique wavelength and/or polarization by adjusting selected GMGRF parameters, such as the grating period and/or the thickness of the grating or other layers. One advantage of this construction is that the various optical emitters and/or optical receivers may be finely tuned, often lithographically, to provide fine wavelength resolution and/or polarization control. For WDM and WDD applications, this may allow closely-spaced optical transmission channels, and may simplify the wavelength-selective WDM and WDD operations required for simultaneous transmission of the channels.

Bit error rate tester

Abstract: The present invention is a bit error rate tester that may operate on network paths having devices that add or drop idles within a transmitted bit sequence In particular, the bit sequence determines whether a received bit sequence is synchronized If the received sequence is not synchronized or if a certain event/threshold is reached, then the bit error rate tester re-synchronizes the sequence prior to analysis Also, the bit error rate detector is able to operate on high-speed networks and provide bit granularity measurements

Out-of-band data communication between network transceivers

Abstract: Out-of-band data communication of diagnostic or other data is performed using transceivers in a data or communication network. A light beam or other carrier is modulated with high-speed data and out-of-band data to create a double modulated data signal. A physical layer signal is created that includes modulations of the double modulated signal. The physical layer signal is transmitted onto a physical link. The diagnostic or other data can be transmitted in the out-of-band signal without substantially reducing or otherwise interfering with the transmission rate of the high-speed data.

Distributed bragg reflector for optoelectronic device

Abstract: An oxide-confined VCSELs(100) having a distributed Bragg reflector (180, 238) with a heavily doped high Al content oxide aperture forming layer (190, 140) disposed between a low Al content first layer (192, 142) and a medium Al content second layer (194, 144). Between the first layer and the oxide aperture forming layer there may be a thin transition region (196, 146) wherein the Al content changes from a higher Al content to a lower Al content. In some embodiments, the Al concentration from the oxide aperture forming layer (190, 140) to the second layer (194, 144) may occur in a step. The oxide aperture forming layer (190, 140) may be disposed at or near a null or a node (y) of the electric field produced by resonant laser light. During the oxidization of the oxide aperture forming layer, all or some of the other aluminum bearing DBR layers (180) may also become oxidized, but to a substantially lesser degree. The junction (214) between the oxidized portion (212) and un-oxidized portion of these layers is believed to reduce the stability and/or reliability of the device. To alleviate this, the present invention contemplates providing an implant (218), etch or other suitable process to reduce or eliminate one or more electrical artifacts associated with the junction between the oxidized portion (212) and un-oxidized portion of these layers (180) as well as reducing the oxidation of other aluminum bearing layers of the DBR (180).