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Ferroelectric gate tunnel field-effect transistors with low-power steep turn-on

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TLDR
Using a ferroelectric PbZrTiO3 gate stack, the range of the steep subthreshold swing in tunnel field effect transistors was extended by 3.5 orders of magnitude demonstrating an improvement in the swing (by approximately double the slope) as mentioned in this paper.
Abstract
Using a ferroelectric PbZrTiO3 gate stack, the range of the steep subthreshold swing in tunnel field-effect transistors was extended by 3.5 orders of magnitude demonstrating an improvement in the swing (by approximately double the slope). The drain conductance (gd) shows only 16% enhancement with large V DS (∼−1.5V) indicates internal voltage amplification with ferroelectric negative capacitance effect beneficial to small lateral drain-source bias voltages (−0.1 V). The concept of coupling the ferroelectric polarization is proposed. The power consumption is also discussed in low-power applications of steep subthreshold slope devices.

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Journal ArticleDOI

Sub-60 mV/decade switching in 2D negative capacitance field-effect transistors with integrated ferroelectric polymer

TL;DR: In this article, a 2D negative capacitance effect with poly(vinylidene difluoride-trifluoroethylene) (P(VDF-TrFE) was used to achieve sub-60mV/decade (below the thermal limit) switching in FETs.
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Non-Volatile Ferroelectric FETs Using 5-nm Hf 0.5 Zr 0.5 O 2 With High Data Retention and Read Endurance for 1T Memory Applications

TL;DR: In this article, a gradual transition of the ferroelectricity with an increasing crystallization temperature for the gate-last process was presented, and the mechanism of retention and endurance was discussed.
Journal ArticleDOI

Investigation of Negative Capacitance Gate-all-Around Tunnel FETs Combining Numerical Simulation and Analytical Modeling

TL;DR: In this article, a short-channel negative capacitance gate-all-around tunnel field effect transistor (NC-GAA-TFET) with a ferroelectric gate stack is proposed.
Journal ArticleDOI

Dopingless ferroelectric tunnel FET architecture for the improvement of performance of dopingless n-channel tunnel FETs

TL;DR: In this article, the authors proposed a novel tunnel field effect transistor (TFET) based on charge plasma (CP) and negative capacitance (NC) for enhanced ON-current and steep sub-threshold swing (SS).
References
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Journal ArticleDOI

Performance Enhancement of Vertical Tunnel Field-Effect Transistor with SiGe in the δp+ Layer

TL;DR: In this article, the authors further investigated the performance enhancement with SiGe in the δp+ layer and showed that the subthreshold swing of the vertical tunnel FET is not limited to the theoretical value of 60 mV/dec at room temperature.
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Measurement of Enhanced Gate-Controlled Band-to-Band Tunneling in Highly Strained Silicon-Germanium Diodes

TL;DR: In this article, the authors have fabricated and analyzed a Si0.6Ge0.4 gated diodes that exhibit significantly enhanced gate-controlled tunneling current over that of coprocessed silicon control devices, which is consistent with device operation based on quantum-mechanical band-to-band tunneling rather than on thermal generation.
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Characteristics of strained-germanium p- and n-channel field effect transistors on a Si (1 1 1) substrate

TL;DR: In this paper, a strained-germanium (Ge) p-and n-channel field effect transistors were grown on the relaxed Si/Si (1 1 1) substrate by ultra-high-vacuum chemical vapour deposition.
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Driving Current Enhancement of Strained Ge (110) p-Type Tunnel FETs and Anisotropic Effect

TL;DR: In this paper, an experimental investigation carried out the strained Ge (110) p-type tunneling field effect transistor, and it resulted in the current enhancement of ×2.9 BTBT in the 112 direction, as compared with Si 110/(100) due to a small band gap.
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Hole mobility enhancement of Si0.2Ge0.8 quantum well channel on Si

TL;DR: In this article, the ultrathin strained Si02Ge08 quantum well channel (∼5nm) was demonstrated with low defect density and high hole mobility, and the channel showed an ∼32 times hole current enhancement and an ∼3 times hole mobility enhancement compared with the bulk Si channel.
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