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Lead-free Solders in Microelectronics

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TLDR
The most widely used Pb-free solders have the eutectic composition as mentioned in this paper, which has been identified as a major factor affecting alloy selection, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation.
Abstract
Practically all microelectronic assemblies in use today utilize Pb–Sn solders for interconnection. With the advent of chip scale packaging technologies, the usage of solder connections has increased. The most widely used Pb–Sn solder has the eutectic composition. Emerging environmental regulations worldwide, most notably in Europe and Japan, have targeted the elimination of Pb usage in electronic assemblies, due to the inherent toxicity of Pb. This has made the search for suitable “Pb-free” solders an important issue for microelectronics assembly. Approximately 70 Pb-free solder alloy compositions have been proposed thus far. There is a general lack of engineering information, and there is also significant disparity in the information available on these alloys. The issues involved can be divided into two broad categories: manufacturing and reliability/performance. A major factor affecting alloy selection is the melting point of the alloy, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation. Other important manufacturing issues are cost, availability, and wetting characteristics. Reliability related properties include mechanical strength, fatigue resistance, coefficient of thermal expansion and intermetallic compound formation. The data available in the open literature have been reviewed and are summarized in this paper. Where data were not available, such as for corrosion and oxidation resistance, chemical thermodynamics was used to develop this information. While a formal alloy selection decision analysis methodology has not been developed, less formal approaches indicate that Sn-rich alloys will be the Pb-free solder alloys of choice, with three to four alloys being identified for each of the different applications. Research on this topic continues at the present time at a vigorous pace, in view of the imminence of the issue.

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Citations
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Journal ArticleDOI

Interfacial reaction issues for lead-free electronic solders

TL;DR: In this paper, the Ni effect on the reactions between solders and Cu is discussed first, and then the Cu effect on Ni is covered in detail, and the knowledge gained from the Cu and Ni effects is applied to explain the recently discovered intermetallic massive spalling, a process that can severely weaken a solder joint.
Journal ArticleDOI

Deformation behavior of (Cu, Ag)–Sn intermetallics by nanoindentation

TL;DR: In this paper, the authors used nanoindentation to extract the elastic and plastic properties of Cu, Sn-3.5Ag solder, Ag3Sn, Cu6Sn5, and Cu3Sn.
Journal ArticleDOI

Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn–3.5Ag, Sn–3.8Ag–0.7Cu and Sn–0.7Cu) on Cu

TL;DR: In this paper, the first phase of intermetallic compound formation in the wetting reaction and the other phases formed in solid-state aging was predicted. But, the morphological change and the large difference in growth rates between the wetter reaction and solid state aging cannot be predicted.
Journal ArticleDOI

Direct Printing of 1-D and 2-D Electronically Conductive Structures by Molten Lead-Free Solder.

TL;DR: The quality of the 3D micro patterns improved significantly when the droplets were deposited at 70 °C and the dot spacing, stage velocity and sample temperature were optimized in the 1D and 2D printing of metallic microstructures.
Journal ArticleDOI

Influence of interfacial intermetallic compound on fracture behavior of solder joints

TL;DR: In this paper, the adhesive strength and shear strength of the solder joints of an as-soldered lead-free solder system with pure copper wires were investigated. And the authors determined how these characteristics, and the relationships between them, are influenced by the storage duration and the storage temperature.
References
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Journal ArticleDOI

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Journal ArticleDOI

Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films

TL;DR: In this article, a Seemann-Bohlin diffractometer was used to investigate interdiffusion and intermetallic compound formation in Cu-Sn thin film couples.
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