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Lead-free Solders in Microelectronics

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TLDR
The most widely used Pb-free solders have the eutectic composition as mentioned in this paper, which has been identified as a major factor affecting alloy selection, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation.
Abstract
Practically all microelectronic assemblies in use today utilize Pb–Sn solders for interconnection. With the advent of chip scale packaging technologies, the usage of solder connections has increased. The most widely used Pb–Sn solder has the eutectic composition. Emerging environmental regulations worldwide, most notably in Europe and Japan, have targeted the elimination of Pb usage in electronic assemblies, due to the inherent toxicity of Pb. This has made the search for suitable “Pb-free” solders an important issue for microelectronics assembly. Approximately 70 Pb-free solder alloy compositions have been proposed thus far. There is a general lack of engineering information, and there is also significant disparity in the information available on these alloys. The issues involved can be divided into two broad categories: manufacturing and reliability/performance. A major factor affecting alloy selection is the melting point of the alloy, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation. Other important manufacturing issues are cost, availability, and wetting characteristics. Reliability related properties include mechanical strength, fatigue resistance, coefficient of thermal expansion and intermetallic compound formation. The data available in the open literature have been reviewed and are summarized in this paper. Where data were not available, such as for corrosion and oxidation resistance, chemical thermodynamics was used to develop this information. While a formal alloy selection decision analysis methodology has not been developed, less formal approaches indicate that Sn-rich alloys will be the Pb-free solder alloys of choice, with three to four alloys being identified for each of the different applications. Research on this topic continues at the present time at a vigorous pace, in view of the imminence of the issue.

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Citations
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Journal ArticleDOI

Correlation Between Sn Grain Orientation and Corrosion in Sn-Ag-Cu Solder Interconnects

TL;DR: In this article, the impact of a marine environment on Sn-Ag-Cu interconnect reliability was examined using salt spray exposure followed by thermal cycling, and an important link between the corrosion path and Sn grain orientation was observed using orientation imaging microscopy.
Journal ArticleDOI

Current-induced phase partitioning in eutectic indium-tin Pb-free solder interconnect

TL;DR: In this article, structural changes from high-density electric currents were examined in a eutectic In-Sn/Cu interconnect, where Sn and In migrated in opposite directions, creating a partition of the Sn- and In-rich phases between the anode and the cathode.
Journal ArticleDOI

Influence of rapid solidification on microstructure, thermodynamic characteristic and the mechanical properties of solder/Cu joints of Sn–9Zn alloy

TL;DR: In this paper, the effects of rapid solidification process on the microstructure, thermodynamic characteristic, electrochemical corrosion properties and spreading properties of Sn-9Zn solder alloys were analyzed.
Journal ArticleDOI

Effect of Ag nanoparticles on microstructure, damping property and hardness of low melting point eutectic tin–bismuth solder

TL;DR: In this paper, the effects of nanosized Ag particles on microstructure, physical and mechanical properties of environmental-friendly low melting point eutectic Sn-Bi solder on Au/Ni-plated Cu substrate were investigated.
Journal ArticleDOI

Effects of continuously applied stress on tin whisker growth

TL;DR: According to these results, application of a continuous tensile stress could provide an effective means in retarding tin whisker growth.
References
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Journal ArticleDOI

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Journal ArticleDOI

Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films

TL;DR: In this article, a Seemann-Bohlin diffractometer was used to investigate interdiffusion and intermetallic compound formation in Cu-Sn thin film couples.
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