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Lead-free Solders in Microelectronics

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TLDR
The most widely used Pb-free solders have the eutectic composition as mentioned in this paper, which has been identified as a major factor affecting alloy selection, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation.
Abstract
Practically all microelectronic assemblies in use today utilize Pb–Sn solders for interconnection. With the advent of chip scale packaging technologies, the usage of solder connections has increased. The most widely used Pb–Sn solder has the eutectic composition. Emerging environmental regulations worldwide, most notably in Europe and Japan, have targeted the elimination of Pb usage in electronic assemblies, due to the inherent toxicity of Pb. This has made the search for suitable “Pb-free” solders an important issue for microelectronics assembly. Approximately 70 Pb-free solder alloy compositions have been proposed thus far. There is a general lack of engineering information, and there is also significant disparity in the information available on these alloys. The issues involved can be divided into two broad categories: manufacturing and reliability/performance. A major factor affecting alloy selection is the melting point of the alloy, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation. Other important manufacturing issues are cost, availability, and wetting characteristics. Reliability related properties include mechanical strength, fatigue resistance, coefficient of thermal expansion and intermetallic compound formation. The data available in the open literature have been reviewed and are summarized in this paper. Where data were not available, such as for corrosion and oxidation resistance, chemical thermodynamics was used to develop this information. While a formal alloy selection decision analysis methodology has not been developed, less formal approaches indicate that Sn-rich alloys will be the Pb-free solder alloys of choice, with three to four alloys being identified for each of the different applications. Research on this topic continues at the present time at a vigorous pace, in view of the imminence of the issue.

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Citations
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Journal ArticleDOI

Retained ratio of reinforcement in SAC305 composite solder joints: effect of reinforcement type, processing and reflow cycle

TL;DR: In this article, the effect of reinforcement type, processing methods and reflow cycle on actual retained ratio of foreign reinforcement added in solder joints was systematically studied, and the morphology of prepared composite solder powder and solder pastes was examined; retained ratios of reinforcement (RRoR) added in composite solder joints after different reflow cycles were analysed quantitatively using an Inductively Coupled Plasma optical system (ICP-OES Varian-720).
Journal ArticleDOI

The bulk alloy microstructure and tensile properties of Sn-1Ag-0.5Cu-xAl lead-free solder alloys (x 0, 1, 1.5 and 2 wt.%)

TL;DR: In this paper, the effect of Al addition on the bulk alloy microstructure and tensile properties of the low Ag-content Sn•1Ag•0.5Cu (SAC105) solder alloy was investigated.
Journal ArticleDOI

Effects of Thermal Aging on Microstructure and Microhardness of Sn-3.7Ag-0.9Zn-1In Solder

TL;DR: In this article, the structural stability of Sn-3.7wt.%Ag-Zn-In alloys was explored by thermal aging at 473 K. According to the microstructural observations, the high cooling rate (about 102 K/s) applied to the water-cooled specimens prompted the formation of β-sn dendrites and inhibited the forming of the AgZn phase.
Journal ArticleDOI

Wettability of Lead-Free Solders on Gold-Plated Copper Substrates

TL;DR: Wettability of lead-free solders (Sn-3Ag-0.5Cu, Sn-8Zn-3Bi, and Sn-9Zn) on Au-plated copper substrate was investigated with three different thicknesses of Au layer (0.1 μm, 0.3 μm and 0.5 μm) as discussed by the authors.
Journal ArticleDOI

Formation of three-dimensional nano-trees with perpendicular branches by electrodeposition of CuSn alloy

TL;DR: In this paper, a three-dimensional nano-tree-like structure consisting of single-crystalline CuSn alloy nanowires branching perpendicularly from their parent branches was observed, and the geometry of the branches had a four-fold symmetry around the parent branch, which originated from the crystalline structure of the mother CuSn crystal.
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Journal ArticleDOI

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Journal ArticleDOI

Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films

TL;DR: In this article, a Seemann-Bohlin diffractometer was used to investigate interdiffusion and intermetallic compound formation in Cu-Sn thin film couples.
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