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Lead-free Solders in Microelectronics

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TLDR
The most widely used Pb-free solders have the eutectic composition as mentioned in this paper, which has been identified as a major factor affecting alloy selection, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation.
Abstract
Practically all microelectronic assemblies in use today utilize Pb–Sn solders for interconnection. With the advent of chip scale packaging technologies, the usage of solder connections has increased. The most widely used Pb–Sn solder has the eutectic composition. Emerging environmental regulations worldwide, most notably in Europe and Japan, have targeted the elimination of Pb usage in electronic assemblies, due to the inherent toxicity of Pb. This has made the search for suitable “Pb-free” solders an important issue for microelectronics assembly. Approximately 70 Pb-free solder alloy compositions have been proposed thus far. There is a general lack of engineering information, and there is also significant disparity in the information available on these alloys. The issues involved can be divided into two broad categories: manufacturing and reliability/performance. A major factor affecting alloy selection is the melting point of the alloy, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation. Other important manufacturing issues are cost, availability, and wetting characteristics. Reliability related properties include mechanical strength, fatigue resistance, coefficient of thermal expansion and intermetallic compound formation. The data available in the open literature have been reviewed and are summarized in this paper. Where data were not available, such as for corrosion and oxidation resistance, chemical thermodynamics was used to develop this information. While a formal alloy selection decision analysis methodology has not been developed, less formal approaches indicate that Sn-rich alloys will be the Pb-free solder alloys of choice, with three to four alloys being identified for each of the different applications. Research on this topic continues at the present time at a vigorous pace, in view of the imminence of the issue.

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Citations
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Journal ArticleDOI

Cu-Cu low temperature bonding based on lead-free solder with graphene interlayer

TL;DR: In order to suppress the immoderate growth of intermetallic compounds (IMCs) at the Sn-Cu bonding interface, Zhao et al. as mentioned in this paper transferred multilayer graphene between the Sn solder and the Cu film sample as an interlayer.
Journal ArticleDOI

Thermodynamic calculation of phase equilibria in the Sn-Ag-Cu-Ni-Au system

TL;DR: In this article, the authors used the calculation of phase diagrams (CALPHAD) method to calculate phase equilibria in the Sn-Ag-Cu-Ni-Au system, which is of importance for developing lead-free solders.
Journal ArticleDOI

Theoretical prediction of thermodynamic activities of liquid Au-Sn-X (X=Bi, Sb, Zn) solder systems

TL;DR: In this article, the authors used a molecular interaction volume model to predict the thermodynamic activities of tin in Au-Sn-Bi and Au-sn-Sb and the thermodynamics activity of zinc in AuSn-Zn at experimental temperatures 800, K, 873 K and 973 K, respectively.
Journal ArticleDOI

Bi2(C2O4)3·7H2O and Bi(C2O4)OH Oxalates Thermal Decomposition Revisited. Formation of Nanoparticles with a Lower Melting Point than Bulk Bismuth

TL;DR: Two bismuth oxalates were studied in terms of synthesis, structural characterization, particle morphology, and thermal behavior under several atmospheres to contribute to the development of the oxalate precursor route for low-temperature soldering applications.
Journal ArticleDOI

Solid/solid interfacial reactions between Sn–0.7 wt% Cu and Ni–7 wt% V

TL;DR: In this paper, a quaternary Q phase is formed in the Sn-0.7 wt% Cu/Ni-7 Wt% V interface at 160, 180, and 210 °C, where the Q is a mixture of nanocrystalline Ni3Sn4 phase and an amorphous phase.
References
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Journal ArticleDOI

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Journal ArticleDOI

Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films

TL;DR: In this article, a Seemann-Bohlin diffractometer was used to investigate interdiffusion and intermetallic compound formation in Cu-Sn thin film couples.
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